Texas Instruments Corporation

Siak Kian Lee

Danny R Cline

Kuong Hua Hii

Tek Yong Lim

Keat Peng Lee

James M Garnett

A short disturb test algorithm for built-in self-test is provided. The short disturb test (108) initially writes a background pattern to all cells in a memory array (24). After verifying the background pattern was written, the opposite of the background pattern is written to a single row of the memory array for a fixed time. After that fixed time has elapsed, the original background pattern is written to the row. The memory array is then refreshed and the next row is written to. After all rows have been written to, the memory array (24) is checked for failures.

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Siak Kian Lee