Growing community of inventors

Singapore, Singapore

Sia Choon Beng

Average Co-Inventor Count = 3.16

ph-index = 4

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 53

Sia Choon BengSanford Chu (4 patents)Sia Choon BengKazuki Negishi (2 patents)Sia Choon BengYeo Kiat Seng (2 patents)Sia Choon BengLap Chan (1 patent)Sia Choon BengPurakh Raj Verma (1 patent)Sia Choon BengJia Zhen Zheng (1 patent)Sia Choon BengChit Hwei Ng (1 patent)Sia Choon BengDavid Randle Hess (1 patent)Sia Choon BengAnthony James Lord (1 patent)Sia Choon BengShao Kai (1 patent)Sia Choon BengGavin Neil Fisher (1 patent)Sia Choon BengJohnny Chew (1 patent)Sia Choon BengGerald Lee Gisler (1 patent)Sia Choon BengChew Kok Wai (1 patent)Sia Choon BengChunyi Yin Leong (1 patent)Sia Choon BengChew Kok-Wai (1 patent)Sia Choon BengSia Choon Beng (8 patents)Sanford ChuSanford Chu (48 patents)Kazuki NegishiKazuki Negishi (18 patents)Yeo Kiat SengYeo Kiat Seng (3 patents)Lap ChanLap Chan (149 patents)Purakh Raj VermaPurakh Raj Verma (144 patents)Jia Zhen ZhengJia Zhen Zheng (81 patents)Chit Hwei NgChit Hwei Ng (22 patents)David Randle HessDavid Randle Hess (8 patents)Anthony James LordAnthony James Lord (7 patents)Shao KaiShao Kai (6 patents)Gavin Neil FisherGavin Neil Fisher (5 patents)Johnny ChewJohnny Chew (3 patents)Gerald Lee GislerGerald Lee Gisler (2 patents)Chew Kok WaiChew Kok Wai (2 patents)Chunyi Yin LeongChunyi Yin Leong (1 patent)Chew Kok-WaiChew Kok-Wai (1 patent)
..
Inventor’s number of patents
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Strength of working relationships

Company Filing History:

1. Chartered Semiconductor Manufacturing Ltd (corporation) (4 from 962 patents)

2. Formfactor, Inc. (2 from 506 patents)

3. Formfactor Beaverton, Inc. (1 from 17 patents)

4. Formfactor, Lnc. (1 from 1 patent)


8 patents:

1. 11454799 - Microscopes with objective assembly crash detection and methods of utiliizing the same

2. 11181550 - Probe systems and methods including electric contact detection

3. 11016121 - Methods of controlling the operation of probe stations and probe stations that perform the methods, the methods including generating and executing a test routine that directs the probe station to electrically test a test subset of a plurality of DUTs and to pre-test a pre-test subset of a plurality of DUTs, which is a subset of the test subset, with a pre-test

4. 10330703 - Probe systems and methods including electric contact detection

5. 6777774 - Low noise inductor using electrically floating high resistive and grounded low resistive patterned shield

6. 6714112 - Silicon-based inductor with varying metal-to-metal conductor spacing

7. 6608362 - Method and device for reducing capacitive and magnetic effects from a substrate by using a schottky diode under passive components

8. 6486017 - Method of reducing substrate coupling for chip inductors by creation of dielectric islands by selective EPI deposition

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as of
12/4/2025
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