Asm Technology Singapore Pte Ltd

Si Ming Chan

Pei Wei Tsai

Chak Tong Sze

Cho Hin Cheuk

Kam Sing Lee

A semiconductor package testing apparatus comprises a package holder for holding a semiconductor package and which is positionable together with the semiconductor package at a test contactor station. There are probe pins located at the test contactor station for contacting a bottom surface of the semiconductor package and which are configured to apply an upwards force on the semiconductor package during testing of the semiconductor package. A restraining mechanism that is movable from a first position remote from the package holder and a second position over the package holder is configured to restrict lifting of the semiconductor package by the probe pins during testing of the semiconductor package when the restraining mechanism is at its second position.

Growing community of inventors

Hong Kong, China

Si Ming Chan