Samsung Display Co., Ltd.

Yonsei University

Si Joon Kim

Joon Geol Kim

Hee Seon Kim

Hyun Jae Kim

Young Jun Tak

Seokhyun Yoon

An array test apparatus includes a signal transmission unit which transmits a data signal to each of a plurality of data lines of a low-temperature polysilicon ('LTPS') substrate, a signal measurement unit which measures the data signal of each of the data lines of the LTPS substrate, a timer which generates a horizontal period for setting a section in which the data signal is transmitted from the signal transmission unit to each of the data lines and a section in which the data signal output from each of the data lines is measured by the signal measurement unit, and a determination unit which determines whether each of the data lines of the LTPS substrate is normal based on the data signal measured by the signal measurement unit.

Array test apparatus and method

Disclosed is a method for repairing an oxide thin film, including repairing the oxide thin film by forming a repairing material that contains an oxide at a defect of the oxide thin film.

Method for repairing oxide thin film and oxide thin-film device

Growing community of inventors

Seoul, South Korea

Si Joon Kim