Chipbond Technology Corporation

Shyh-Jen Guo

Cheng-Hung Shih

Wen-Tung Chen

Chin-Tang Hsieh

You-Ming Hsu

A semiconductor structure having a first corner includes a carrier, a first protective layer, a second protective layer, and a third protective layer. The carrier comprises a carrier surface having a protection-layered disposing zone. The first protective layer comprises a first surface having a first disposing zone, a first anti-stress zone and a first exposing zone, the first anti-stress zone is located at a corner of the first disposing zone, the second protective layer is disposed at the first disposing zone. The second protective layer comprises a second surface having a second disposing zone, a second anti-stress zone and a second exposing zone, the second anti-stress zone is located at a corner of the second disposing zone. The first anti-stress zone and the second anti-stress zone are located at the first corner. An area of the first anti-stress zone is not smaller than that of the second anti-stress zone.

Semiconductor structure

A bump structure comprises a first polymer block, a second polymer block, a first groove, an under bump metallurgy layer and a connection metal layer, wherein the first polymer block and the second polymer block are individual blocks. The first polymer block comprises a first connection slot, and the second polymer block comprises a second connection slot communicated with the first groove and the first connection slot. The under bump metallurgy layer covers the first polymer block and the second polymer block to form a second groove. The connection metal layer covers the under bump metallurgy layer to form a third groove, wherein the under bump metallurgy layer covers a first coverage area of the first polymer block and a second coverage area of the second polymer block and reveals a first exposure area of the first polymer block and a second exposure area of the second polymer block.

Bump structure and process of manufacturing the same

A bump structure comprises a first polymer block, a second polymer block, a first groove, an under bump metallurgy layer and a connection metal layer, wherein the first polymer block and the second polymer block are individual blocks. The first polymer block and the second polymer block are located at two sides of the first groove, the first polymer block comprises a first connection slot, and the second polymer block comprises a second connection slot communicated with the first connection slot and the first groove. The under bump metallurgy layer covers the first polymer block and the second polymer block to form a second groove, a third connection slot and a fourth connection slot communicated with each other. The connection metal layer covers the under bump metallurgy layer to form a third groove, a fifth connection slot and a sixth connection slot communicated with each other.

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Hsinchu, Taiwan

Shyh-Jen Guo