General Electric Company

Shyamsunder Tondanur Mandayam

Yuri Alexeyevich Plotnikov

Thomas James Batzinger

Ui Won Suh

Changting Wang

William Stewart McKnight

Bryon Edward Knight

Venkata Vijayaraghava Nalladega

Gigi Olive Gambrell

Satheesh Jeyaraman

Preeti Pisupati

Amitabha Dutta

Walter Joseph Bantz

Esha SenGupta

Esha Sen Gupta

Mottito Togo

A system for inspecting a coating on a substrate, the system including a platform that receives a sample including the substrate having the coating, and a light source that directs a plurality of electromagnetic pulses towards a scanning location on the coating, wherein the light source is oriented to direct the plurality of electromagnetic pulses at an oblique angle relative to a surface of the coating. A light detector receives electromagnetic pulses reflected from the sample, wherein a first portion of each electromagnetic pulse is reflected from the surface of the coating, and a second portion of each electromagnetic pulse is reflected from a surface of the substrate. An actuator is coupled to the platform and/or the light source, wherein the actuator moves the platform and the light source relative to each other such that the plurality of electromagnetic pulses are directable towards the scanning location from different rotational positions.

Systems and methods of assessing a coating microstructure

A method for inspecting a component is presented. The method includes inducing, by an inductive coil, an electrical current flow into the component. Further, the method includes capturing, by an infrared (IR) camera, at least a first set of frames and a second set of frames corresponding to the component, wherein the first set of frames is captured at a first time interval and a second set of frames is captured at a second time interval. Also, the method includes constructing, by a processing unit, a thermal image based on at least the first set of frames and the second set of frames corresponding to the component. Furthermore, the method includes determining presence of a thermal signature in the thermal image, wherein the thermal signature is representative of a defect in the component.

System and method for detecting defects in a component

An eddy current inspection system and method for inspecting a component is provided. The system includes an eddy current probe for sensing eddy currents from the component and an analog to digital converter configured for converting eddy currents to digital signals. The system also includes a processor configured for generating an eddy current image from the digital signals and pre-processing the image to enhance a quality of the image. The processor is configured to identify regions displaying flaw patterns and calculating a defect characterizing parameter for the identified regions.

Eddy current inspection method and system

An eddy current (EC) probe for inspecting a component is provided. The EC probe includes a tangential drive coil configured to generate a probing field for inducing eddy currents in the component, where a portion of the eddy currents are aligned parallel to an edge of the component. An axis of the tangential drive coil is aligned parallel to a surface of the component. The EC probe further includes a pair of sense coils, where an axis of the sense coils is aligned perpendicular to the surface of the component. The sense coils are configured to sense the portion of the eddy currents aligned parallel to the edge of the component.

Eddy current probe and inspection method

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Bengaluru, India

Shyamsunder Tondanur Mandayam