Perceptron, Inc.

Solidica, Inc.

Shyam P Keshavmurthy

Chengchih Lin

David Crowther

Richard Krakowski

Alfred A Pease

Craig Manning

Dawn White

David Carmein

Martin P Koskella

Brett Hibbard

George C Lin

Jason Wilson

David T Wegryn

Ralph Stefan

A non-contact sensing system is provided for acquiring three-dimensional contour information of an object. The system is comprised of: a light source subsystem operable to scan a point of light in an area of illumination; a first imaging device having a field of view arranged to intersect with the illumination area and operable to capture image data; and a second imaging device having a field of view arranged to intersect with the illumination area and operable to capture image data. A first control module is in data communication with the first imaging device to determine contour information for an object in the field of view of the first imaging device and report the contour information for the object in a common coordinate system. A second control module is in data communication with the second imaging device to determine contour information for the object in the field of view of the second imaging device and report the contour information for the object in the common coordinate system. Moreover, the light source subsystem is calibrated to report position of the point of light in the common coordinate system.

Non-contact sensing system having MEMS-based light source

A system and method is provided for imaging an article within a field of view, projecting an illumination field onto the article within field of view, and selectively projecting illumination structures onto the article within the field of view. Then, image data corresponding to the illumination field and the illumination structures may be received and a feature of the article may be analyzed based on the illumination field and the illumination structures.

Hybrid system

A structured light sensor system for measuring contour of a surface includes a control module that coordinates control of both a projection system and an imaging system to operate the structured light sensor system in three different modes. The imaging system is configured to selectively capture an image of light reflected off of the surface. In point mode, the imaging system is on for a first period during which the projection system projects a point of light onto the surface. In line mode, the imaging system is on for a second period during which the projection system projects onto the surface a first plurality of points of light forming a line of light. In area mode, the imaging system is on for a third period during which the projection system projects onto the surface a second plurality of points of light forming a plurality of lines of light.

Contour sensor incorporating MEMS mirrors

A sensor system and method for analyzing a feature in a sensing volume. The system projecting a pattern onto the feature and imaging the pattern where the pattern intersects with the feature, where the pattern is a series of lines that are encoded to identify at least one line of the series of lines.

Hybrid sensor

A sensor system and method for analyzing a feature in a sensing volume is provided. The system receives image data from a sensor, where the image data including peaks corresponding to the intersection of laser lines with the feature. The system generates a dynamic window based on the entropy of the peaks.

System and method for dynamic windowing

A sensor system and method for analyzing a feature in a sensing volume. The system imaging the feature with a first sensor and a second sensor that cooperate to form a contiguous sensing volume.

A sensor system for analyzing a feature in a sensing volume. The sensor system includes a laser source and a sensor. The first laser source projects a laser line into the sensing volume and onto the feature forming a laser stripe on the feature. The sensor images the laser stripe where the laser line intersects with the feature. The relationship between the sensor and the first laser source is precalibrated. The sensor uses the laser stripe to determine the position and/or orientation of the feature.

A structured light sensor system for measuring contour of a surface includes an imaging lens system, an image capturing device, a first set of micro electromechanical system (MEMS) mirrors, and a control module. The imaging lens system focuses light reflected from the surface, wherein the imaging lens system has a corresponding lens plane. The image capturing device captures the focused light and generates data corresponding to the captured light, wherein the image capturing device has a corresponding image plane that is not parallel to the lens plane. The first set of MEMS mirrors direct the focused light to the image capturing device. The control module receives the data, determines a quality of focus of the captured light based on the received data, and controls the first set of MEMS mirrors based on the quality of focus to maintain a Scheimpflug tilt condition between the lens plane and the image plane.

Materials and methods inhibit the localized build-up of material with respect to certain additive manufacturing processes, including those based on ultrasonic consolidation. Where an object is fabricated by consolidating material increments from a feedstock in accordance with a description of the object, the invention prevents the consolidation in specified regions to provide for an intrinsic support or to otherwise build a part or component in accordance with the description. The object being fabricated, the feedstock, or both, may be treated so as to inhibit the consolidation of material increments in the localized area. That is, such treatment may affect the surface chemistry of the feedstock to prevent local bonding, or the treatment may be applied to a previously built surface of the object. The treatment may include the introduction of an oxidizer, such as a metal nitrate, chlorate, chromate, peroxide, or manganate; a base or alkali; or a coating of a lubricious material such as tin, Teflon, or petroleum distillates to prevent the breakup of an oxide layer.

Method and materials to inhibit object consolidation in localized areas

A surface inspection system is provided for detecting defects on a surface of a workpiece. The surface inspection system includes a diffused light source for emitting an elongated line of light onto the surface of the workpiece, a movable member for translating the workpiece in relation to the light source, an imaging device positioned at a vantage point such that the line of light is within its field of observation for capturing two or more sets of image data representative of a portion of the surface of the workpiece, and a data structure for storing model data, where the model data is indicative of the spatial relationship between the surface of the workpiece and the observation plane of the imaging device. The surface inspection system further includes an anomaly detection module adapted to receive the image data from the imaging device and for identifying at least one potential surface defect in the image data, and a defect tracking module connected to the data structure and the anomaly detection module for tracking the potential surface defect from the first set of image data to the second set of image data by using said model data, thereby assessing if the potential surface defect constitutes a defect in the surface of the workpiece.

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Ann Arbor, MI, United States of America

Shyam P Keshavmurthy