Nippon Telegraph and Telephone Corporation

Shunsuke Tsukatani

Shingo Ando

Atsushi Sagata

Tetsuya Kinebuchi

Kazuhiko Murasaki

Labels can be accurately identified even for an image with a resolution not used in training data. Based on an input image, a resolution of the input image, and a resolution of a training image used for training a trained model of assigning labels to pixels of an image, a plurality of low-resolution images are generated from the input image by using a plurality of shift amounts for a pixel correspondence between the input image and the respective low-resolution images with a resolution corresponding to the training image, the low-resolution images are input to the trained model, a plurality of low-resolution label images is output in which pixels of the respective low-resolution images are assigned labels, and a label image is output in which labels for pixels of the input image are obtained, based on the shift amounts used for generating the low-resolution images and the low-resolution label images.

Image processing device, method, and program

The disclosed technology describes determining and registering dictionary data to diagnose a deteriorating state of a surface of a diagnose object. The method comprises receiving spectral distribution information of deteriorating surface regions of a target object. Given the spectral distribution information and a predetermined spectral distribution information of a reference object, the present technology determines a reference reflectance value of the target object and registers the reference reflectance value of the target object as dictionary data. The reference reflectance value is approximately the same regardless of a progressing state of deterioration of a surface of the target object. Given the dictionary data, the present invention estimates a deterioration state of a surface of a diagnose object under a variety of type of light sources with accuracy, without measuring spectral distribution information about a light source used at the time of measuring spectral data of the diagnose object.

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Tokyo, Japan

Shunsuke Tsukatani