Oval Corporation

Shunji Saitoh

Hirokazu Kitami

Hideki Shimada

Tatsumi Kameyama

Provided is a measuring instrument for measuring an object to be measured, including: a CPU () including a plurality of internal timer counters and having a function of calculating a measured value of the object to be measured based on detection values of various sensors; a power supply circuit () for supplying power to the CPU (); a detector () for detecting a state of the object to be measured; a display unit () for displaying detection input data input from the various sensors and the state of the object to be measured, which is obtained through a calculation; a real-time clock IC (RTC) () for measuring an elapsed time; an EEPROM () for storing data input to the CPU (); and an FeRAM () for storing input values from the various sensors, and storing a calculation result obtained through a calculation performed by the CPU () based on the input values from the various sensors.

Maintenance expert system for measuring instrument

A processing method for an operation system which performs operation processing in accordance with a detection amount detected by detection means and pulse output processing in which an operation result from the operation processing is transmitted as a pulse output, including: controlling transmission of the pulse output performed in the pulse output processing to make the transmission of the pulse output asynchronous with a timing of an end of the operation processing; and transmitting, by repeating the controlling, a pulse train having time-series continuity.

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Tokyo, Japan

Shunji Saitoh