Tdk Corporation

Shunichi Yuri

Yukie Nakano

Masayuki Sato

Mari Miyauchi

Daisuke Iwanaga

Tsutomu Odashima

Takako Hibi

Yosuke Konno

Yasuhiro Ito

Akira Sato

Takashi Morita

Wataru Takahara

Takahiro Ushijima

Yushi Kanou

Masako Yoshii

Kazushige Ito

Masakazu Hosono

Kenta Yamashita

A ceramic electronic component includes an interior part and an exterior part. The interior part includes an interior part dielectric layer and an internal electrode layer. The exterior part includes an exterior part dielectric layer. The exterior part is positioned outside the interior part along a laminating direction thereof. The interior part dielectric layer and the exterior part dielectric layer respectively contain barium titanate as a main component. &#x3b2;&#x2212;&#x3b1;&#x2265;0.20 and &#x3b1;/&#x3b2;&#x2264;0.88 are satisfied, where &#x3b1; mol part and &#x3b2; mol part are respectively an amount of a rare earth element contained in the interior and exterior part dielectric layers, provided that an amount of barium titanate contained in the interior and exterior part dielectric layers is respectively 100 mol parts in terms of BaTiO.

Ceramic electronic component

A ceramic electronic component includes a dielectric layer and an electrode layer. The dielectric layer contains barium titanate and yttrium. The dielectric layer contains dielectric particles and Y&#x2014;Ti segregation particles. An area ratio occupied by the Y&#x2014;Ti segregation particles is 1.3% or less on a cross section of the dielectric layer.

A ceramic electronic component includes a dielectric layer and an electrode layer. The dielectric layer contains a plurality of ceramic particles and grain boundary phases present therebetween. A main component of the ceramic particles is barium titanate. An average thickness of the grain boundary phases is 1.0 nm or more. A thickness variation &#x3c3; of the grain boundary phases is 0.1 nm or less.

A method of producing a multilayer ceramic electronic device, having a firing step for firing a pre-firing element body wherein a plurality of dielectric layers and internal electrode layers containing a base metal are alternately arranged, characterized in that the firing step has a temperature raising step for raising a temperature to a firing temperature, and hydrogen is continued to be introduced from a point in time of the temperature raising step. According to the method, it is possible to provide a method of producing a multilayer ceramic electronic device, such as a multilayer ceramic capacitor, wherein shape anisotropy and other structural defaults are hard to occur and electric characteristics are improved while suppressing deterioration thereof even if dielectric layers becomes thinner and stacked more.

Production method of multilayer ceramic electronic device

A method of producing a multilayer ceramic capacitor having internal electrode layers and dielectric layers with dielectric particles is disclosed. An average particle diameter of the dielectric particles, when measured parallel with the direction of the internal electrode layers, is larger than a thickness of the dielectric layer. A ratio (R/d) between the average particle diameter (R) and the thickness (d) of the dielectric layer is 1&#x3c;R/d&#x3c;3.

Method of making a multilayer ceramic capacitor

In order to provide dielectric ceramic composition having low IR defect rate and high relative dielectric constant even when the multilayer ceramic capacitor is made thinner, dielectric ceramic composition including a main component expressed by a composition formula {{BaCa}O}{TiZrMg}Oand subcomponents of Mn oxide, Y oxide, V oxide and Si oxide is provided. In the above formula, A, B, x, y and z are as follows: 0.995&#x2266;A/B&#x2266;1.020, 0.0001&#x2266;x&#x2266;0.07, preferably 0.001&#x2266;x&#x3c;0.05, 0.1&#x2266;y&#x2266;0.3 and 0.0005&#x2266;z&#x2266;0.01, preferably 0.003&#x2266;z&#x2266;0.01.

Dielectric ceramic compositions and electronic devices

A multilayer ceramic capacitor having internal electrode layers and dielectric layers with dielectric particles is disclosed. An average particle diameter of the dielectric particles, when measured parallel with the direction of the internal electrode layers, is larger than a thickness of the dielectric layer. A ratio (R/d) between the average particle diameter (R) and the thickness (d) of the dielectric layer is 1<R/d<3.

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Tokyo, Japan

Shunichi Yuri