Canon Kabushiki Kaisha

Shunichi Shido

Kunihiro Sakai

Takahiro Oguchi

Akihiko Yamano

Katsunori Hatanaka

Ryo Kuroda

Takeaki Itsuji

Takayuki Yagi

Junichi Seki

Susumu Yasuda

Toshihiko Takeda

Toshihiko Miyazaki

Hideo Mori

Hiroyasu Nose

Yoshihiro Yanagisawa

Kiyoshi Takimoto

Yuji Kasanuki

Teruyoshi Washizawa

An imaging apparatus includes a display device for suppressing a motion blur during a panning operation and displaying a picture with high simultaneity. The imaging apparatus also includes: an imaging unit including a lens and an imaging element; a display device including a pixel whose light emission period is adjustable, for displaying an image of a target object to be imaged; an angular velocity sensor for detecting a movement of the imaging element; a panning speed detection unit for detecting a panning speed based on an output from the angular velocity sensor; a light emission period ratio determination unit for determining a light emission period ratio of the pixel based on the panning speed; and a display device driving unit for driving the display device by using the light emission period ratio determined by the light emission period ratio determination unit.

Imaging apparatus and image display method therefor

In order to permit stable gradation display or high-speed display, when predetermined voltages are applied to a collection electrodeand a display electrode, respectively, to move particles between the collection electrodeand the display electrode, a voltage is applied to a pressing electrodeto press the particles against the display electrodeso that they are stabilized on the display electrodewith a uniform spacing therebetween.

Particle movement-type display apparatus and driving method thereof

A signal detector comprises a frequency changing circuit adapted to receive an electric signal having a frequency modulated from a first reference frequency f with a modulation width &Dgr;f as input, convert the received electric signal to an electric signal having a second reference frequency f lower than the first reference frequency f and output the converted electric signal and a frequency/voltage conversion circuit adapted to receive the output of the frequency changing circuit as input and output a voltage corresponding to the ratio of the modulation width &Dgr;f to the second reference frequency f and an electric signal having a frequency modulated from a reference frequency Nf with a modulation width of N&Dgr;f (N: integer).

Signal detector and probe microscope using the same

A non-contact-type atomic microscope including a plurality of probes differing in resonance frequency, an actuator for vibrating the plurality of probes simultaneously, and a drive signal generating circuit for generating a drive signal for the actuator. The drive signal contains a predetermined frequency for vibrating each of the plurality probes. Also, there is a method for observing a surface shape of a sample by using a plurality of probes. The method includes a step of vibrating the plurality of probes simultaneously with a common actuator in a vicinity of their resonance frequencies. A signal for driving the actuator contains a predetermined frequency for vibrating each of the probes.

Non-contact type atomic microscope and observation method using it

A drive stage comprises a support body, a plurality of movable parts movably supported relative to the support body, and an actuator for driving the plurality of movable parts to move. The plurality of movable parts are driven by the actuator to move in directions selected to mutually offset the inertial forces generated in the respective movable parts. The drive stage is suitably used as incorporated into a scanning probe microscope or an information recording/reproducing apparatus for driving a probe or a mechanical stage supporting a specimen or a recording medium.

Drive stage and scanning probe microscope and information recording/reproducing apparatus using the same

A scanning probe having a piezo resistance cantilever section is used with a signal detector comprising a signal detection circuit for detecting a change in the piezo resistance and a circuit for removing an offset component from the signal. Such a scanning probe is used for a scanning probe microscope, in particular an atomic force microscope to obtain a high resolution surface image.

Signal detector to be used with scanning probe and atomic force microscope

A detection apparatus for detecting the surface of a specimen by means of a cantilever having a probe and a piezo resistance element, which comprises a first circuit for detecting an electric current flowing through the piezo resistance element and a second circuit for detecting an electric current flowing through the probe. The electric current flowing through the piezo resistance element and the electric current flowing through the probe are detected by way of a common current path.

Detection apparatus and detection method to be used for scanning probe and observation apparatus and observation method

A tracking mechanism for an apparatus which records and/or reproduces data on and/or from a medium through a relative scan of the medium with probes, the medium being formed with a plurality of tracking bit trains disposed in parallel at a predetermined distance between trains, the tracking mechanism having: a plurality of probes disposed at a predetermined distance between probes; and a tracking controller for performing a tracking control in accordance with outputs from the plurality of probes, the outputs being obtained when the plurality of tracking bit trains are scanned with the plurality of probes. A tracking method for such an apparatus includes the steps of: scanning the plurality of tracking bit trains with a plurality of probes disposed at a predetermined distance between probes; and performing a tracking control in accordance with outputs from the plurality of probes, the outputs being obtained when the plurality of tracking bit trains are scanned with the plurality of probes.

Tracking mechanism and method using probes for information recording/reproducing apparatus

In an information recording/reproducing apparatus for effecting recording/reproduction of information using a probe, a recording bias is applied to between a recording medium and the probe to record information on the recording medium. A current flowing through the recording medium and the probe is detected. The detected current is determined whether it exceeds a predetermined value. When the detected current exceeds the predetermined value, the application of the recording bias is stopped after a predetermined time.

Information recording/reproducing apparatus and method using probe

A torsion type probe for scanning probe microscopes, especially for atomic force microscopes, includes a supporting block, a torsion beam device arranged on the supporting block, a thin-film plane plate rotatably supported by the torsion beam means, and a tip formed on the thin-film plane plate. The torsion beam device include a piezoresistor, which is preferably formed in the surface or lateral walls of the torsion beam device, to detect torsion of the torsion beam device as the probe scans the surface of a sample.

Torsion type probe and scanning probe microscope using the same

An information processing apparatus is used for recording and/or reproducing information on a recording medium by means of a plurality of probes. The apparatus comprises a substrate carrying thereon a plurality of probes arranged two-dimensionally in a plane, at least three sensors at three different points on the substrate for detecting the distance between the substrate and the recording medium, a switching circuit for selecting a parallel connection or a serial connection for the sensors, and a regulating system for regulating the relative inclination and the distance between the probe plane and the recording medium surface plane according to the output of the sensors connected in series and that of the sensors connected in parallel.

Information processing apparatus having face regulating system

In recording of information, a voltage is applied to between a probe and a recording medium. A capacitor stores charges from a DC power supply. A switch is provided so as to disconnect the capacitor and the DC power supply. When information is to be recorded, the capacitor and the DC power supply are disconnected from each other by the switch and the charges stored in the capacitor are output to the probe or recording medium.

Information recording apparatus and method of recording information by

An information processing apparatus for scanning a recording medium by means of a probe and recording and reading information by means of a physical interaction occurring between the recording medium and the probe, including, a device for generating a plurality of sets of image information with different resolutions from input image information, a device for successively recording the sets of of image information in a predetermined order on the medium, and a device for reading only a reproduction-necessary region on the recording medium, according to a resolution demanded, upon reproduction of the image information.

Information processing apparatus capable of readily changing resolution

An information processing apparatus, which utilizes a physical phenomenon occurring between a probe and a sample to detect information from the sample, includes a device for moving the probe in order to adjust a clearance between the probe and the sample, a device for detecting a physical phenomenon occurring between the probe and the sample, a device for generating a control signal for the moving device to change the clearance between the probe and the sample to a desired clearance, based on a result of detection of the detecting device, and a device for applying an offset signal to the control signal in order that the probe can move with respect to a reference located at a position deviated from a center position of a movable range of the probe by means of the moving device.

Information processing apparatus using an offset signal to control the

In an information processing apparatus, at least one of recording and reproduction of information is performed while two-dimensionally scanning a recording medium with a probe, utilizing a physical phenomenon occurring between the probe and the medium. The apparatus includes a scanning mechanism for effecting relative movement between the probe and the medium so as to translate the probe as drawing a circular or elliptic locus on the medium and a recording and/or reproducing circuit for performing at least one of the recording and reproduction of information, utilizing the physical phenomenon during the relative movement.

Growing community of inventors

Sagamihara, Japan

Shunichi Shido