Toray Industries, Inc.

Hitachi-High-Technologies Corporation

National Cancer Center

Shun-ichi Watanabe

Satoko Kozono

Hiroko Sudo

Takahiro Ochiya

Junpei Kawauchi

Satoshi Kondou

Yuho Kida

Mitsugu Sato

Satoshi Yamaguchi

Hiroyuki Tanaka

Atsushi Takane

Shigeto Isakozawa

Hiromi Inada

Yoichi Ose

Takashi Onishi

Kuniyasu Nakamura

Masaru Moriyama

Tomonori Suzuki

This application provides a kit or a device for detection of lung cancer, comprising a nucleic acid(s) for detecting a miRNA(s) in a sample from a subject, and a method for detecting lung cancer, comprising measuring the miRNA(s) in vitro.

Kit, device, and method for detecting lung cancer

The objective of the present application is to suppress the occurrence of flares and to reduce the amount of secondary electrons arising at an aperture provided to the lead-out electrode of an electron gun. By coating a thin film having a low rate of secondary electron emission such as carbon onto the aperture of a lead-out electrode closest to an electron source in an electron gun, it is possible to reduce the amount of secondary electrons arising. Secondary electrons arising at the lead-out electrode, are reduced, and so as a result, flare is reduced. By incorporating two apertures to the lead-out electrode, and applying to the two apertures a potential that is equipotential to the lead-out electrode, it is possible to eliminate an electric field from seeping from under to over the lead-out electrode. Secondary electrons arising when an electron beam impacts the lead-out electrode cease to incur force in the direction of passage from the lead-out electrode, and consequently there is a reduction in flares.

Electron gun and charged particle beam device having an aperture with flare-suppressing coating

Charged particle beam equipment has a processing unit for calibrating dimension values of an enlarged specimen image, and means for changing the amount by which a charged particle beam is scanned. Also, a specimen stand has a mechanism for holding a specimen having a periodical structure or a specimen simultaneously having a periodical structure and a non-periodical structure, and a storage device for automatically changing a magnification for an enlarged specimen image, and storing measured values at all magnifications.

Charged particle beam equipment

Charged particle beam equipment has a processing unit for calibrating dimension values of an enlarged specimen image, and means for changing the amount by which a charged particle beam is scanned. Also, a specimen stand has a mechanism for holding a specimen having a periodical structure or a specimen simultaneously having a periodical structure and a non-periodica structure, and a storage device for automatically changing a magnification for an enlarged specimen image, and storing measured values at all magnifications.

Growing community of inventors

Tokyo, Japan

Shun-ichi Watanabe