Taiwan Semiconductor Manufacturing Comp. Ltd.

Shun-An Chen

Ko-Pin Chang

Hui-Tang Liu

Tzu-Jeng Hsu

Yao-Tung Liu

James You

Constance Chu

Yung-Min Cheng

Ying-Wei Hsu

Chun-Sheng Wang

Ming-Hui Lin

Jui-An Shin

Hsin-Hom Chen

Li-Chung Lin

A method for switch dual Id verification systems for installing another carrier ID system on an equipment installation complying with SEMI E87. A first identification access system has internally installed on an equipment installation on which a second identification access system is then installed. Both systems are switched using a control flow and a wafer carrier ID is obtained by the chosen verification system.

Dual ID verification system and switching method therefor

A system for monitoring semiconductor testing tools comprises a tester testing a semiconductor device, whereby a test result is derived, a storage device storing a logic function corresponding to the semiconductor device, and a processor receiving the test result and the logic function from the tester and storage device respectively, and applying the logic function to the test result for validation.

System for validating and monitoring semiconductor testing tools

A system for managing quality control in a manufacturing plant for processing lots of work in process (WIP) for at least one product, comprises a manufacturing process which includes a manufacturing executive system (MES) which provides inspection data to a statistical process control (SPC) database, and an SPC analyzer for analyzing the inspection data and providing a sampling rate rule output to a sampling rate database. A server supplies the sampling rate rule to the MES. The MES tests a condition as to whether a lot of WIP should be sampled. If the condition is met, then provide an inspect control signal for inspection to the plant for inspecting the lot. If the condition is not met, then branch away from the control signal to provide an alternative control signal to pass on to the next process step in the plant.

Statistical in-process quality control sampling based on product stability through a systematic operation system and method

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Kaohsiung, Taiwan

Shun-An Chen