Asahi Kasei E-materials Corporation

Adv Antest Corporation

Shuichiro Ogawa

Hiroaki Takanohashi

Kentaro Shiraishi

Junichi Hirose

Waka Goto

Katsuhito Nagano

Provided is a coating composition excellent in antifouling properties, transparency and hydrophilicity, wherein the coating composition contains (A) a metal oxide particle having a number average particle size of 1 nm to 400 nm; and (B) a polymer particle, in which the content of an aqueous-phase component in the component (B), represented by the expression (I), is 20 mass % or less, where (I) (%)=(dry mass of a filtrate obtained by filtering the component (B) at a molecular cutoff of 50,000)&#xd7;(100&#x2212;total mass of solid content)/(mass of the filtrate&#x2212;dry mass of the filtrate)&#xd7;100/the total mass of solid content.

Coating composition, coating film, laminate and process for manufacturing the laminate

Coating composition, coating film, laminate, and process for manufacturing the laminate

Provided is a coating composition excellent in antifouling properties, transparency and hydrophilicity, wherein the coating composition contains (A) a metal oxide particle having a number average particle size of 1 nm to 400 nm; and (B) a polymer particle, in which the content of an aqueous-phase component in the component (B), represented by the expression (I), is 20 mass % or less, where (I)(%)=(dry mass of a filtrate obtained by filtering the component (B) at a molecular cutoff of 50,000)&#xd7;(100&#x2212;total mass of solid content)/(mass of the filtrate&#x2212;dry mass of the filtrate)&#xd7;100/the total mass of solid content.

Coating composition, coating film, laminate, and process for production of laminate

A failure analyzing system for displaying a position of a failure in a semiconductor device, includes: a circuit position memory for storing physical positions of respective circuits included in the semiconductor device; a defective information acquisition unit for acquiring information on a defective circuit included in the semiconductor device; and a display for displaying the defective circuit on a layout of the semiconductor device with a color that is different between the physical positions.

Failure analyzing system and method for displaying the failure

Growing community of inventors

Tokyo, Japan

Shuichiro Ogawa