Mitutoyo Corporation

Shuichi Kamiyama

Sadayuki Matsumiya

Tomoyuki Miyazaki

Shigeru Ohtani

Yoshiro Asano

Masanori Arai

Hideyuki Arai

Yoshihiko Takahashi

Kazuhiko Hidaka

Yu Sugai

Hiroshi Sakai

Hidemitsu Asano

Susumu Yoshioka

Ken Motohashi

Hiromu Maie

Yutaka Nishitsuji

Minoru Tanaka

Kazuya Iwasaki

Yoshinosuke Murai

A measuring head includes a first slide mechanism for a first measurement axis provided to be detachable to external moving devices; a second slide mechanism for a second measurement axis held to be movable by the first slide mechanism; a third slide mechanism for a third measurement axis held to be movable by the second slide mechanism; a probe held to be movable by the third slide mechanism; pneumatic cylinders for connecting slider parts and guide parts included in each slide mechanism; and automatic pressure regulators for respectively changing air pressures supplied to each pneumatic cylinder in accordance with measurement postures of the measuring head.

Measuring head

A probe includes a movable plate to which a stylus capable of contacting a measurable object is mounted, the movable plate displaceable in an X direction; a static plate arranged to overlap with the movable plate; a counter plate facing the movable plate and the static plate; an elastic movable side connection plate, the movable side connection plate connecting the counter plate at at least three places with each of a first end connector positioned toward a first end of the movable plate in the X direction and second end connectors positioned toward a second end in the X direction; and a static side connection plate which connects the static plate and the counter plate. An entire length of the first end connector in a Y direction orthogonal to the X direction is the same size as the entire length of the second end connectors in the Y direction.

Measurement probe and measuring device

A surface texture measuring apparatus includes an X axis displacement mechanism and a Y axis displacement mechanism displacing a measurable object having an interior wall along an XY plane; a measurement sensor measuring a surface texture of the interior wall without contact; a Z axis displacement mechanism displacing the measurement sensor in a Z axis direction orthogonal to the XY plane and bringing the measurement sensor to face the interior wall; a W axis displacement mechanism displacing the measurement sensor facing the interior wall in a normal direction of the interior wall; and a &#x3b8; axis displacement mechanism displacing the measurement sensor facing the interior wall along the interior wall.

Surface texture measuring apparatus

Dial gauge inspection machine

A coordinates measuring head unit is provided, which is compact, inexpensive, and capable of performing high-precision measurements at high speeds, and facilitates, for example, measurements conducted on machine tools or in-situ measurements on transport lines. The head unit includes: drive means (an X-axis drive section, a Y-axis drive section, and a Z-axis drive section), an integrated housing for accommodating the drive means, and fixture means (fixture surface). The drive means allows a probe to be moved by computer numerical control along a plurality of drive axis, which are orthogonal to each other, and abut against a measuring target to measure the dimensions of the measuring target. The fixture means is provided on one of side surfaces of the housing to attach one of the drive means to a support (a support on a stand secured to a base).

Coordinates measuring head unit and coordinates measuring machine

A stage apparatus () includes a stage glass () having on an upper surface a stage surface () of a substantially flat plane on which a predetermined workpiece (W) is set, a plane light emitter () with a flat plane, which is provided to substantially all over a lower surface of the stage glass () and illuminates the workpiece (W) with contour illumination through the stage glass (), and a supporting section (), which supports at plurality of points on a lower face side of the plane light emitter () and adjusts the flatness of the stage surface () by adjusting the height at a plurality of supporting points.

Stage apparatus and vision measuring apparatus

A probe alignment adjuster () for adjusting an angle of a probe () for measuring a configuration of a workpiece has an angle adjuster () capable of adjusting the angle of the probe so that the angle aligns with a reference axis line. Since the angle of the probe and a hole angle can be accurately coincided in measurement by coinciding the angle of the probe () and the reference axis line, interference with a sidewall caused in inserting into a deep hole can be avoided, thereby preventing damage on the probe.

Alignment adjuster of probe, measuring instrument and alignment adjusting method of probe

Growing community of inventors

Kanagawa, Japan

Shuichi Kamiyama