Boe Technology Group Co., Ltd.

Hefei Boe Display Technology Co., Ltd.

Shandong Jianzhu University

China National Machine Tool Quality Supervision Testing Center

Shuai Ji

Ping Chen

Song Wu

Guodong Wu

Hewei Wang

Haitao Hu

Hao Yu

Junfeng Li

Chen Tang

Jianwei Yu

Jinjiang Wang

Zuguang Huang

Mingming Mu

Fugai Chen

Lixiong Li

Ruijuan Xue

Tianliang Hu

Hepeng Ni

Chengrui Zhang

An electromagnetic immunity test system includes a data acquisition and control device, a linear module, an electromagnetic disturbance simulator, and an upper computer. The data acquisition and control device is in a data connection to the linear module, the electromagnetic disturbance simulator, and the upper computer. The linear module includes a grating ruler; and the linear module is disposed on the numerical control machine tool to measure location data of the sliding table of the numerical control machine tool and transmit the location data to the data acquisition and control device. The electromagnetic disturbance simulator is configured to generate and transmit an electromagnetic signal to the numerical control system. The data acquisition and control device is configured to read the location data in real time and transfer the real-time location data to the upper computer.

Electromagnetic immunity test system and control method thereof

The present disclosure relates to a liquid crystal panel and a repairing method thereof, and a display device. The liquid crystal panel includes an array substrate and a filter substrate, and the repairing method includes: irradiating a pixel which is a bright spot of the liquid crystal panel with laser from one side of the array substrate away from the filter substrate, so that a portion of the array substrate located in the pixel is converted from a light transmitting area into a light shielding area.

Liquid crystal panel and repairing method using a laser thereof, and display device

A method for repairing the gate-line disconnection includes: determining a disconnected position of a gate line; determining two connecting elements that are closest to the disconnected position and are respectively located at two sides of the disconnected position along an extending direction of the gate line; selecting one or two sub-pixels electrically connected to the two connecting elements as repair sub-pixels, determining a common electrode line coupled to a common electrode of each repair sub-pixel as a selected common electrode line; forming a communication path between a front portion and a rear portion at the disconnected position to bypass the disconnected position, the communication path including at least the common electrode of each repair sub-pixel and a separate line segment cut from the selected common electrode line; disconnecting the common electrode in the communication path from other common electrodes; and disconnecting each repair sub-pixel from a data line.

Methods for repairing gate-line disconnection and short circuit between gate line and data gate and repair structure

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Beijing, China

Shuai Ji