Mediatek Corporation

National Yang Ming Chiao Tung University

Mediatek Singapore Pte. Ltd.

Shu-Lin Lai

Yi-Te Chiu

Yi-Ping Kuo

Chia-Wei Wang

Chi-Hao Hong

Wei Hwang

Hao-I Yang

Shih-Huang Huang

Ching-Te Chuang

Shyh-Jye Jou

Jiann-Tseng Huang

Ming-Hsien Tu

Dao-Ping Wang

Po-Tsang Huang

Chien-Yu Lu

Shu-Hsuan Lin

Chi-Shin Chang

Yi-Wei Chen

Chien-Hen Chen

Kim Soon Jway

Ya-Ting Yang

Che-Wei Chou

Jia-Jing Chen

Chi-Kai Hsieh

A memory with built-in synchronous-write-through (SWT) redundancy includes a plurality of memory input/output (IO) arrays, a plurality of SWT circuits, and at least one spare SWT circuit. The at least one spare SWT circuit is used to replace at least one of the plurality of SWT circuits that is defective.

Memory with built-in synchronous-write-through redundancy and associated test method

A self-repair memory circuit includes a cell array, a controller, a row repair decoder, and a column repair decoder. The cell array includes rows and columns of memory cells. The controller receives an input indicating row repair or column repair, and a repair address shared by the row repair and the column repair of the cell array. The row repair decoder maps the repair address of a defective row to a redundant row of the cell array when the input indicates the row repair. The column repair decoder maps the repair address of a defective column to another column of the cell array when the input indicates the column repair.

Memory with fuse pins shared by multiple-type repairs

A sense amplifier for reading a via Read-Only Memory (Via-ROM) is provided. The sense amplifier includes a read circuit, an adaptive keeper circuit and a leakage monitor circuit. The read circuit is connected to the via-ROM. The adaptive keeper circuit is connected to the read circuit. The leakage monitor circuit is connected to the adaptive keeper circuit for forming a current mirror, such that the adaptive keeper circuit compensates a read voltage of a memory cell whose via is opened when a bit-line leakage is happened.

Sense amplifier

A pre-processing circuit is used for pre-processing a data-line voltage representative of a data output of a memory device. The pre-processing circuit includes a pre-charging circuit and a clamping circuit. The pre-charging circuit pre-charges a data line to adjust the data-line voltage at the data line that is coupled to the memory device. The clamping circuit clamps the data-line voltage to generate a clamped data-line voltage when the data-line voltage is pre-charged to a level that enables a clamping function of the clamping circuit, wherein the clamped data-line voltage is lower than a supply voltage of the pre-processing circuit. The clamping circuit includes a feedback circuit that feeds back a control voltage according to the data-line voltage at the data line, and further reduces its direct current (DC) leakage when the data-line voltage is clamped, wherein the clamping function of the clamping circuit is controlled by the control voltage.

Pre-processing circuit with data-line DC immune clamping and associated method and sensing circuit

A sense amplifier circuit includes a single-ended sense amplifier and an isolation switch. The isolation switch is coupled between a bias node and a first line of a memory device, receives an output of the single-ended sense amplifier and selectively isolates the bias node and the first line in response to the output of the single-ended sense amplifier. The first line is coupled to a plurality of memory cells of the memory device.

Sense amplifier circuits

A static random access memory includes a pre-charger, a first cell column array/peripheral circuit, and a first ripple buffer. The pre-charger is connected to a first local bit line in order to pre-charge the first local bit line. The first cell column array/peripheral circuit is connected to the first local bit line and has a plurality of cells for temporarily storing data. The cells are connected to the first local bit line. The first ripple buffer is connected to the first local bit line and a second local bit line in order to send the data from the first local bit line to the second local bit line.

Static random access memory with ripple bit lines/search lines for improving current leakage/variation tolerance and density/performance

Growing community of inventors

Taichung, Taiwan

Shu-Lin Lai