The Schepens Eye Research Institute, Inc.

Massachusetts Eye and Ear Infirmary

Shrinivas Pundlik

Gang Luo

Eliezer Peli

Kevin Edward Houston

Matteo Tomasi

Methods, systems, and devices are provided for measuring dark adaptation of one or both eyes of a patient, and more particularly, for measuring dark adaptation with a mobile device application. An exemplary method includes exposing an eye of a patient to a light source to bleach a retinal location of the eye, displaying on a mobile device a figure with a luminance and waiting until the patient communicates with the mobile device to acknowledge that the patient can see the figure, measuring and recording a level of the luminance and a time period between first displaying the figure and the patient communicating with the mobile device, continuing to display additional figures with decreasing luminance one at a time, and determining by a processor dark adaptation measurements of the patent based on the measured and recorded luminance and time periods.

Measuring dark adaptation

Disclosed are a mobile device and method which include acquiring, by an image acquisition unit installed in a mobile device, an image of eyes of a patient while light provided by a light source reflects from an optical surface of the eyes of the patient; and obtaining, by a processor installed in the mobile device, ocular misalignment measurements, including a magnitude and a direction of ocular misalignment in the eyes of the patient, using the acquired image or set of images.

Mobile device application for ocular misalignment measurement

In some implementations, there is provided a method. The method may include receiving data characterizing a plurality of digital video frames; detecting a plurality of features in each of the plurality of digital video frames; determining, from the detected features, a local scale change and a translational motion of one or more groups of features between at least a pair of the plurality of digital video frames; and calculating a likelihood of collision. Related apparatus, systems, techniques, and articles are also described.

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Boston, MA, United States of America

Shrinivas Pundlik