Didi Research America, LLC

Shray Kapoor

Dong Li

Jing Chen

Huaiyu Zhu

Michael Lin

Yichong Lin

Process states of computing devices may be obtained and processed. Process event information of a computing device may be obtained. The process event information may characterize states of processes of the computing device. The process event information may be stored within a queue. Graph information may be determined based on the process event information within the queue. The graph information may characterize states of processes of the computing device using nodes and edges. The graph information may be stored within a graph database.

System and method for process state processing

Process states of computing devices may be collected for processing. Process event information of a first computing device may be determined based on an observation of process creation events and process termination events, a garbage collection, and a process scan. The process event information may be provided to a second computing device.

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Fremont, CA, United States of America

Shray Kapoor