Shimadzu Corporation

Shozo Ino

Hiroshi Daimon

Shuji Hasegawa

A charged particle analyzer comprises a spherical grid, a spherical electrode concentric with each other, an emission portion for emitting charged particles, a screen plate having an exit opening, a plurality of second spherical grids forming a high pass filter for the charged particles, a detector for detecting the charged particles, and an obstacle ring being in parallel with an equatorial plane normal to a line connecting the emission portion and the center of the exit opening and being within the spherical electrode.

Spherical electrode type charged particle analyzer

A charged particle analyzer comprises a spherical grid, a spherical electrode, a screen plate, and a detector. The spherical electrode is outside of the spherical grid and is concentric with the spherical grid. The screen plate has an entry window and an exit opening, which are symmetrical with the center of the sphere of the spherical grid. A sample is disposed at the entry window of the screen plate. The detector is positioned behind the exit opening to detect charged particles emitted from the sample. The charged particles having the same energy can travel through the exit opening of the screen plate, and their amount or their angular distribution is measured.

Charged particle analyzer

A method for observing the arrangement of atoms in a thin layer on a surface and an apparatus for employing the method are disclosed. According to the method, a finely converged electron beam is directed to a surface of a sample and the X-ray emitted from the surface is detected at a take-off angle equivalent to, or in the vicinity of, the total reflection angle, thereby avoiding interference from X-rays emitted beneath the surface. The apparatus includes an electron gun, a sample holding means, one or more detectors and devices for storing, processing and displaying the output signal from the detectors. The apparatus also provides for two-dimensional scanning of a surface and for adjustment of the position of the sample and of the detectors.

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Tokyo, Japan

Shozo Ino