General Electric Company

Shourya Sarcar

Bernard Patrick Bewlay

Arpit Jain

Alberto Santamaria-Pang

Patrick Joseph Howard

Shaopeng Liu

Xiao Bian

Feng Xue

Colin James Parris

Yousef Ahmed Al-Kofahi

Bruce Courtney Amm

Michael J MacDonald

Aritra Chowdhury

Eric Seth Moderbacher

Peter Arjan Wassenaar

A method of inspecting a component using an image retrieval module includes storing an inspection image file in a memory and identifying a region of interest in the inspection image file. The method further includes accessing a database storing image files and determining feature vectors associated with the image files. The method also includes determining a hash code for each image file based on the feature vectors and classifying a subset of image files as relevant based on the hash codes. The method further includes sorting the subset of image files based on the feature vectors and generating search results based on the sorted subset of image files. The image retrieval module includes a convolutional neural network configured to learn from the determination of the feature vectors and increase the accuracy of the image retrieval module in classifying the image files.

Inspection systems and methods including image retrieval module

An image inspection computing device is provided. The device includes a memory device and at least one processor. The at least one processor is configured to receive at least one sample image of a first component, wherein the at least one sample image of the first component does not include defects, store, in the memory, the at least one sample image, and receive an input image of a second component. The at least one processor is also configured to generate an encoded array based on the input image of the second component, perform a stochastic data sampling process on the encoded array, generate a decoded array, and generate a reconstructed image of the second component, derived from the stochastic data sampling process and the decoded array. The at least one processor is further configured to produce a residual image, and identify defects in the second component.

Systems and methods for automatic defect recognition

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Niskayuna, NY, United States of America

Shourya Sarcar