Yokogawa Electric Corporation

Shouji Igarashi

Hidekazu Tanaka

Yuichi Nozaka

Tomoaki Eto

Masahide Yoshikawa

Tomohiro Kajikawa

A failure detection apparatus () includes a RAM () and a controller () configured to execute processing related to detection of a physical quantity in a predetermined sampling period (T). The RAM () includes partitioned areas generated by partitioning the entire area of the RAM (). The controller () is configured to execute sequential failure detection on a portion of the partitioned areas during a time when the controller () is not executing the processing in each of the sampling periods (T).

Failure detection apparatus, failure detection method, and non-transitory computer readable recording medium

A sensor calibration device for calibrating a sensor device, includes a sensor reader configured to read, from a reference sensor, a physical quantity which is a reference of a calibration and detected by the reference sensor, and a sensor manager configured to convert the physical quantity read by the sensor reader into a reference measurement value, the sensor manager being configured to obtain a calibration target measurement value obtained by the sensor device measuring the physical quantity, and the sensor manager being configured to output, to the sensor device, a calibration instruction based on the reference measurement value and the calibration target measurement value.

Growing community of inventors

Musashino, Japan

Shouji Igarashi