Hitachi, Ltd.

Hitachi Plant Engineering Construction Co., Ltd.

Shojiro Asai

Kazuo Takaragi

Kozo Mochiji

Atsushi Tanaka

Hiromichi Fujisawa

Toshiaki Masuhara

Michio Suzuki

Hideo Sunami

Masaru Ohki

Shinji Okazaki

Takeshi Kimura

Kenji Kaneko

Minoru Ashizawa

Yasuko Fukuzawa

Hidehito Obayashi

Atsushi Saiki

Michiyoshi Maki

Hajime Morito

Rei Itsuki

Hideki Tokuyama

Kinichiro Asami

The present invention discloses a method and system for making losses due to the counterfeiting of RF-ID tags to a minimum, enhancing the reliability of RF-ID tag read-out and improving the overall reliability of the RF-ID tag system. An ID reader for communicating by radio with the RF-ID tag and reading tag data from the RF-ID tag transmits the data read-out results to a terminal management server connected to the ID reader. The terminal management server decodes the error correction signal from the read-out result data, also extracts the identification number section from the tag, and decides whether or not that identification number is valid. When determined to be a valid identification number, an inquiry is made to the system operation server connected over the network to find out if that identification number was previously read out and if that identification number might be counterfeit. The system operation server then refers to the log database, the blacklist database and process transition rule, calculates the probability of counterfeiting and automatically sends a warning message to the related department when there is a high probability of counterfeiting.

Method and system for identifying and managing radio frequency identification (RF-ID) attached objects

A RFID tag structure determining the authenticity of an article, and an information processing system for reading RFID tags, enable authenticity determinations of articles using read only RFID tags. A plurality of RFID tags, each holding tag information inside ROM (read-only memory) and responding to tag information via a radio wave received from a reader, are designed to have a service identifier which designates a common utilization goal for which the same value is set, and service data which sets different values for the respective RFID tags, as tag information. By dividing the data structure of a RFID tag having a read-only memory into a service identifier, which is common to a certain product, and sequential data for managing individual products, it is possible to confirm that an article is authentic by simply confirming the service identifier.

RFID tag, and RFID tag-related determining device and method, and management system and method

Object management in a distributed system includes at least one attribute information management server for managing attribute information of the object in correspondence with identification information given to the object, at least one identification information management server for managing the attribute information management server in correspondence with the identification information, and at least one supporting server for supporting handling of the object in accordance with the attribute information is connected to a user terminal over a network.

Handling support method and handling support system

An X-ray exposure system including a plurality of X-ray exposure apparatuses each for duplicating a mask pattern on a semiconductor wafer by irradiating an X-ray mask and the semiconductor wafer with synchrotron radiation is disclosed in which a synchrotron radiation path branching device including a reflecting mirror is disposed between a synchrotron ring and the X-ray exposure apparatuses, and the propagation direction of the synchrotron radiation emitted from the synchrotron ring is changed by the reflecting mirror so that the synchrotron radiation from the ring can be introduced into each of the X-ray exposure apparatuses.

X-ray exposure system

A clean room wherein clean air obtained through filters from the upper portion of the clean room is blown toward the floor, through the openings in the floor, and with the clean air being discharged again through the filters from the upper portion of the clean room. The air flow rate of clean air in the aisle areas is greater than the air flow rate in the wafer handling areas, and the opening rate of the floor is smaller in the portion near to an air return under the floor than in the portion remote from the air return thereby greatly reducing the diffusion of dust to the wafer handling areas.

Clean room

A method of forming a pattern comprising heat-treating a resist film subjected to irradiation with light and thereafter removing an unhardened area of the resist film. Since the heat treatment reduces the film thickness of the unhardened area and hardens a hardened area still more, a pattern on the order of submicrons can be readily formed.

Method of forming a pattern

An electron device comprising (i) a semiconductor element which includes a semiconductor region A of a first conductivity type, a semiconductor region B of a second conductivity type adjoining the region A, and a semiconductor region C of the second conductivity type adjoining the region A and isolated from the region B by the region A, and in which on a surface extending from the region B via the region A to the region C, a gate electrode is provided through an insulating film, (ii) means for holding a potential of the gate electrode so that a potential of minority carriers in a surface portion of the region A underneath the gate electrode may become lower than a potential in an inner portion of the region A, (iii) means for applying a forward bias voltage between the region A and the region B, and (iv) means for applying to the region C a potential by which a potential for the minority carriers becomes lower in the region C than in the region B. The electron device is capable of such operations as amplification, oscillation and memory under an extraordinarily low supply voltage, and is extraordinarily low in the power consumption.

Electron device

Growing community of inventors

Tokyo, Japan

Shojiro Asai