Toshiba Medical Systems Corporation

Canon Medical Systems Corporation

Shoji Yashiro

Seiichirou Nagai

Tsutomu Ichikawa

Yasuhiro Sugawara

Seiichi Nishizuka

Katsunori Kojima

Tatsuaki Kodaka

Toshikatsu Oohashi

Norio Soutsuka

Junji Masahashi

Atsushi Kotani

Rulin Du

Tamotsu Ino

The X-ray diagnostic apparatus according to any of embodiments includes an X-ray tube, an X-ray detector and processing circuitry. The X-ray tube is configured to irradiate an imaging region of a subject with X-rays. The X-ray detector is configured to detect the X-rays. The processing circuitry is configured to acquire an incident angle of the X-rays corresponding to a clinical purpose of the imaging region, and acquire image data from an image sensor that images the imaging region. The processing circuitry is configured to rotate the X-ray tube in accordance with the acquired incident angle of the X-rays, and slide a position of a central path of the X-rays with respect to the imaging region based on the image data.

X-ray diagnostic apparatus

An X-ray diagnosis apparatus includes a holding device, a drive unit, a route specify unit, an operation direction detector, and a drive controller. The holding device holds an X-ray tube and is configured to be movable. The drive unit is capable of moving the holding device. The route specify unit specifies a movement route from a current position of the holding device to a target position. The operation direction detector detects operation direction, which is the direction of moving operation that the holding device has received. The drive controller controls the drive unit to stop a driving force when the operation direction differs from the direction of the movement route.

X-ray diagnosis apparatus

An exposure management system according to an embodiment includes a processing circuitry. The processing circuitry is configured to calculate a deviation index related to a difference between a target exposure index indicating an index of an exposure value that is set as a target of an X-ray image taking process and an image-taking-period exposure index indicating an index of an exposure value observed during the X-ray image taking process. The processing circuitry is configured to control so as to cause a display device to display history information from a predetermined time period indicating at least one selected from between image-taking-period exposure indices and deviation indices.

Exposure management system

Growing community of inventors

Nasushiobara, Japan

Shoji Yashiro