Kabushiki Kaisha Toshiba

Toshiba Medical Systems Corporation

Canon Medical Systems Corporation

Abbott Laboratories Corporation

Shoichi Kanayama

Shigehide Kuhara

Kazuhiro Itsumi

Isao Nawata

Kozo Sato

Yoshimori Kassai

Motoji Haragashira

Ichiro Tono

Arturo Calderon

Asuka Hirano

Naoko Omuro

Omar S Khalil

Takeshi Yamauchi

Naru Ikeda

Asuka Uchikawa

Kanako Iwamura

Naotada Okada

Tzyy-Wen Jeng

Tomohiro Takase

Stanislaw Kantor

Tomohiro Sugimura

Masahiro Kumakura

Reiko Maruyama

Nobuyasu Kobayashi

Tomoyuki Tada

Naoko Ito

Dylann Ceriani

Shu-Jen Yeh

Sigehide Kuhara

Naoko Murase

Bob Eisele

A specimen measurement device which detects a measurement object material according to the present embodiment, includes: a magnetic field applicator configured to apply a magnetic field to a measurement cartridge including a substrate, a first substance fixed on the substrate and specifically reacting with the measurement object material, a magnetic particle, and a substance fixed on the magnetic particle and specifically acting with the measurement object material; a detector configured to detect light passing through the substrate; and a controller configured to control the magnetic field applicator to perform a first operation to apply a first magnetic field in a direction to move the magnetic particle away from the substrate when a specimen solution containing the measurement object material is introduced into the measurement cartridge, and then perform a second operation to apply a second magnetic field in a direction to move the magnetic particle toward the substrate.

Specimen measurement device and control method of specimen measurement device

According to one embodiment, a sample inspection apparatus includes a photodetection circuitry, an image sensor, processing circuitry, and an output interface. The photodetection circuitry has light incident on an optical waveguide in an inspection container and detects the light having propagated within the optical waveguide and coming out of the optical waveguide. The image sensor acquires an image signal for the optical waveguide, using scattered light originated from the light propagating within the optical waveguide. The processing circuitry acquires one or more inspection index values based on at least one of an output of the photodetection circuitry or an output of the image sensor. The output interface outputs a result of processing by the processing circuitry.

Sample inspection apparatus

According to one embodiment, a specimen measurement apparatus includes a detector, a reaction promoter and processing circuitry. The detector generates an electrical signal based on a reactive state in a reaction chamber in which a mixture of a test substance and a reagent is contained. The reaction promoter supplies to the reaction chamber energy to promote reaction in the reaction chamber. The processing circuitry switches an energy supply state in accordance with a predetermined time schedule, determines a stationary state of the test substance based on an electrical signal generated after the energy supply state is switched, and outputs the stationary state obtained by the determination.

Specimen measurement apparatus

According to one embodiment, there is provided an automatic analyzing apparatus which comprises determination processing circuitry, an analyzer mechanism and data processing circuitry. The determination processing circuitry determines whether to continue reaction of a solution mixture based on reaction data. The analyzer mechanism generates analytical data based on test data generated by measuring the solution mixture. The data processing circuitry performs control such that the analytical data is generated in a first measurement section if it is determined that continuation of the reaction of the solution mixture is unnecessary, and the analytical data is generated by measuring the solution mixture after the first measurement section if it is determined that continuation of the reaction of the solution mixture is necessary.

Automatic analyzing apparatus

A according to one embodiment, an optical measurement system has an optical waveguide sensor chip mounted thereon, the optical waveguide sensor chip has a space defined by a plurality of surfaces including a first surface along which an optical waveguide part is provided. The optical measurement system includes a holding surface, a light transceiver, and a contact sensor. The holding surface holds the bottom surface of the optical waveguide sensor chip. The light transceiver lets light be incident on the optical waveguide sensor chip through a first window in the holding surface, and receives light that has passed through the first surface via the optical waveguide part from a second window in the holding surface. The contact sensor detects contact state in two or more detection positions located along an array direction of the first window and the second window.

Optical measurement system

A test reagent includes a reactant and a sheet-shaped member. The reactant is in a dry state and specifically reacts with a test substance. The sheet-shaped member holds the reactant and disperses in a solvent solution in which the reactant dissolves.

Test reagent, test reagent kit, and specimen measuring system

An in-vitro diagnostic includes a housing, a storage, and a blocking agent. The housing houses a liquid including a test substance included in a sample extracted from a subject. The storage stores a substance that specifically reacts with the test substance. The blocking agent is placed to separate the container and the storage.

In-vitro diagnostic

According to one embodiment, a sample analyzer includes a detector, a first generator and a second generator. The detector detects a target substance bonded to a magnetic particle collected to a sensing area in the cartridge. The first generator applies a magnetic field for releasing the magnetic particles from the sensing area. The second generator includes a permanent magnet configured to generate a magnetic field for attracting the magnetic particles to the sensing area, a first soft magnetic material, and a second magnetic material. The second generator switches application and shut-off of a magnetic field by moving the permanent magnet relative to the first soft magnetic material and the second soft magnetic material.

Sample analyzer

A sample liquid preparing apparatus includes a first cylinder portion, a cap portion, and a liquid preparation vessel. The first cylinder portion has a first to-be-fixed portion and a second to-be-fixed portion. The first cylinder portion accommodates a first plug and a second plug. A liquid is sealed between these plugs. The cap portion includes a plunger portion to push the second plug and a first fixing portion to limit the plunger portion from pushing the second plug by fixing the first to-be-fixed portion. The liquid preparation vessel includes a second cylinder portion whose internal space is pressed by the first cylinder portion and a second fixing portion to limit the first cylinder portion from pushing by fixing the second to-be-fixed portion.

Sample liquid preparing apparatus, test kit, and sample liquid preparing method

According to one embodiment, an automatic analyzer comprises a light source, a spectroscope, a photo detection unit, a storage unit, a selection unit, and a calculation unit. The storage unit stores photo detector identifiers related to photo detectors and wavelength band identifiers in association with each other. The selection unit selects a specific photo detector from photo detectors. The specific photo detector corresponds to a specific photo detector identifier associated with a wavelength band identifier of a wavelength band according to a measurement item of a sample. The calculation unit calculates an absorbance related to the measurement item based on a signal from the selected specific photo detector.

Automatic analyzer

Disclosed is an automatic analyzer that analyzes a component of a target layer of a test sample separated into a plurality of layers by transferring the component from an installed container, including: a dispensing probe that descends into the target layer and suctions the component; a detecting unit that detects the height of the layer surface of the target layer of the test sample; a calculating unit that calculates the depth from the layer surface of the target layer at which the total content of the component of the target layer reaches a target amount; and a controller that causes the dispensing probe to descend to the depth calculated by the calculating unit and suction the component.

According to one embodiment, a specimen measurement apparatus includes a detector and a control circuit, and is configured to perform a plurality of steps to measure the properties of a test substance retained in a reaction container. The detector outputs electromagnetic waves to the reaction container and detects the electromagnetic waves that vary according to the state in the reaction container. The control circuit controls transition timing between steps of the plurality of steps based on the detection result of the electromagnetic waves obtained by the detector.

Specimen measurement apparatus and specimen measurement method

The analyzer according to the embodiment comprises an irradiation optical part that irradiates a mixture inside reaction tubes with light from a light source. Moreover, a detection optical part detects light transmitted through the mixture. Moreover, the irradiation optical part comprises a first optical element in which the light source is disposed at the front focal position and that concentrates light from the light source. Moreover, a second optical element guides light transmitted through the first optical element to the reaction tubes. In addition, an incident numerical aperture adjustment member is provided at the rear side of the first optical element and adjusts the numerical aperture when light from the light source is incident on the reaction tubes.

Analyzer

According to one embodiment, an automatic analyzer includes a reaction disc, cleaning mechanism, and cover. The reaction disc holds a cuvette which contains a sample and a reagent. The cleaning mechanism is configured to clean the cuvette using a nozzle. The cover is configured to be movable along an axis of the nozzle and to cover an opening of the cuvette.

An automatic analysis apparatus according to an embodiment incudes a dispensing probe, a cleaning unit, and a driving mechanism. The dispensing probe performs a dispensing operation for sucking a sample and discharging the sample into a reaction container. The cleaning unit cleans the dispensing probe. The cleaning unit includes a first cleaning position at which the dispensing probe is cleanable using a first cleaning liquid, and a second cleaning position which is located at a position lower than the first cleaning position and at which the dispensing probe is cleanable using a second cleaning liquid. The driving mechanism stops the dispensing probe at at least one of the first cleaning position and the second cleaning position.

Growing community of inventors

Otawara, Japan

Shoichi Kanayama