The Yokohama Rubber Co., Ltd.

Shohei Nakayama

Akira Yamada

Kenhachi Mitsuhashi

Yoshinobu Ohashi

Shigeru Shinoda

Youichi Yamaguchi

A device for continuously measuring and correcting a tackiness of a sheet of rubber material including a feeding unit for continuously feeding an unvulcanized rubber sheet along a flat support surface and a rotatable roller in contact with the unvulcanized rubber sheet, whereby the roller is rotated by the movement of the unvulcanized rubber sheet, and entrained in the sheet feed direction due to a tackiness of the unvulcanized rubber sheet. A load cell is connected to the roller via a linkage, for measuring a resistance to the rolling of the roller, i.e., a change of a position of the roller entrained in the sheet feed direction. The device also includes a correcting unit for correcting a tackiness of the sheet of unvulcanized rubber material, the correcting unit being controlled by a control element in response to an output from the measuring unit, in such a manner that the correcting unit acts on the surface of the unvulcanized rubber sheet of rubber material when an output from the measuring unit is outside a predetermined range of tackiness.

Device for continuously measuring and correcting tackiness of sheet of

A tension tester in which a specimen marked with at least one measuring marking whose optical characteristic is different from that of the specimen's ground color is held by chucks at the ends and subjected to a tensile load by moving one of the chucks; in which, while the specimen is being stretched, the marking is scanned by a scanner to detect a positional change of the marking in the tensile direction; and in which electric signals which are produced due to the difference in the optical characteristic between the marking and the specimen's ground color are processed to determine the tensile characteristic of the specimen. In this tension tester, the scanner consists of a first scanner with its field of view set to the entire elongation range of the specimen; and at least one second scanner having its field of view set only to a low elongation range of the specimen, the second scanner either having a greater number of elements than the first scanner or being adapted to perform a magnified scanning with greater magnification than that of the first scanner.

Growing community of inventors

Odawara, Japan

Shohei Nakayama