Toshiba Memory Corporation

Kioxia Corporation

Kabushiki Kaisha Toshiba

Shohei Asami

Toshikatsu Hida

Riki Suzuki

Yoshihisa Kojima

Takehiko Amaki

Marie Grace Izabelle Angeles Sia

Masanobu Shirakawa

Marie Takada

Tsukasa Tokutomi

Masamichi Fujiwara

Tokumasa Hara

Hiroshi Yao

Mitsunori Tadokoro

Kenichiro Yoshii

Osamu Torii

Kazuhiro Fukutomi

Mitsuru Anazawa

Hirokazu Morita

Yuka Kuwano

According to one embodiment, a memory system includes a semiconductor memory, a controller, and a first circuit. The semiconductor memory includes a nonvolatile memory cell. The controller is configured to cause the semiconductor memory to execute first and second write operations. The first write operation writes a first bit into the memory cell. The second write operation writes first data based on the first bit and a second bit into the memory cell. The first circuit checks whether or not the first bit includes a bit error. The controller is configured to cause the semiconductor memory to execute, in the second write operation, writing of the first data including the second bit and a third bit obtained by correcting the bit error of the first bit, in a case that the first bit includes the bit error.

Memory system

According to one embodiment, a memory system includes a semiconductor memory and a controller. The semiconductor memory includes blocks each containing memory cells. The controller is configured to instruct the semiconductor memory to execute a first operation and a second operation. In the first operation and the second operation, the semiconductor memory selects at least one of the blocks, and applies at least one voltage to all memory cells contained in said selected blocks. A number of blocks to which said voltage is applied per unit time in the second operation is larger than that in the first operation.

According to one embodiment, a memory system includes a semiconductor memory and a controller. The semiconductor memory includes first to fourth word lines and first to fourth memory cells. The controller is configured to issue first and second instructions. The controller is further configured to execute a first operation to obtain a first read voltage based on a threshold distribution of the first memory cell, and a second operation to read data from the second memory cell.

According to one embodiment, a memory system includes a non-volatile memory and a memory controller. The non-volatile memory includes a plurality of groups, each including a plurality of memory cells. The memory controller is configured to determine whether to execute a refresh process for a first group based on whether a first temperature in a write process for the first group and a second temperature after the write process for the first group satisfy a first condition.

According to one embodiment, a memory system includes: a memory chip including a first memory block and first word lines, the first memory block including a first memory string which includes first memory cells that are coupled in series, the first word lines being respectively coupled to gates of the first memory cells; a memory controller coupled to an external device, controlling the memory chip, and capable of performing an error checking and correcting process of data. When a write instruction is received from the external device, the memory controller is configured to perform a write operation on a second memory cell which is one of the first memory cells, and to perform a read verify operation including a read process and the ECC process on a third memory cell which is one of the first memory cells.

Memory system that uses NAND flash memory as a memory chip

A memory system includes a nonvolatile memory and a memory controller. The memory controller is configured to execute a process to adjust a temperature of the nonvolatile memory upon determining that the temperature is outside a preferred range.

Memory system and method of controlling nonvolatile memory

A memory system includes a semiconductor memory including memory cells and a memory controller configured to perform a first tracking process to determine a first voltage, and to read data using the first voltage in a read process after the first tracking process. In the first tracking process, the memory controller is configured to read only first, second, and third data respectively using a second, third, and fourth voltage, determine a number of first memory cells based on the first and second data, determine a number of second memory cells based on the second and third data, and determine the first voltage, based on the number of first and second memory cells.

Growing community of inventors

Fujisawa, Japan

Shohei Asami