Fujitsu Corporation

Fujitsu Microelectronics Limited

Shogo Shibazaki

Hiroyuki Itoh

Tomohiro Hayashi

Shinpei Komatsu

Masaru Takehara

Yumi Ishii

Takeshi Nagase

Shinkichi Gama

Chikahiro Deguchi

Yutaka Sekino

Hideyuki Negi

A memory test is performed by sequentially generating a number of n-bit addresses, whose first to k-th bits (1&#x2266;k&#x2266;n) are all set to one of two values, 0 or 1, and whose (k+1)th to n-th bits are all set to the other one of the two values, for all k's which range from 1 to n; writing first test data to each of the generated addresses in the memory; reading second test data from each of the addresses in the memory; and comparing the first test data with the second test data.

Memory test method and memory test device

A test apparatus includes an up counter, a down counter, a selector that selects either an up counter output from the up counter or a down counter output from the down counter, an inversion circuit that inverts either the counter output selected by the selector or the counter output nonselected by the selector, and a comparison circuit that compares the counter output inverted by the inversion circuit and the other counter output.

Test apparatus, test method, and integrated circuit

An encryption/decryption processing unit performs encryption/decryption processing of data transmitted from a host system, and encryption/decryption processing of key data used for encryption/decryption of the data. A key data buffer temporarily stores encrypted key data. A key data buffer temporarily stores unencrypted key data. An external memory interface controls flash memory attached outside, and reads/writes encrypted key data stored in the key data buffer.

Encryption device

Data transferred from a host computer to a memory device is written into sectors whose addresses in a memory area are decoded by a decode table. Old data to be updated by the above data is erased or marked with erase flags. At a predetermined point of time, in order to create free areas, necessary data is evacuated to a primary memory media and unnecessary data indicated by erase flags is erased by a unit of predetermined memory size. Part of the memory media which has become defective is marked with a defect flag, and is replaced by an alternate area. In doing so, the decode table is rewritten to arrange the memory area.

Method of writing, erasing, and controlling memory for memory device

In a storage device for maintaining information when power is OFF and being capable of executing a test process based on test signals, a test terminal inputs the test signals and an instruction part sends a read out instruction for instructing a memory storing secret data to read out data. Moreover, a decoding part decodes whether or not the data read out by the memory in response to the data reading instruction is the secret data stored in the memory and a maintaining part maintains information in a volatile state resulting from the decoding part. Furthermore, a cutting-off part cuts off the test signals input from the test terminal when the maintaining part maintains information indicating that the secret data is stored.

Storage device having secure test process

The present invention relates to a method of producing a memory management table that controls memories having a function to hold data at a time of power cut-off and manages identifier information of memory areas which are data storage destinations designated by a logical address issued by a host device. After an initializing process, the host device is immediately notified of canceling of a busy state, without production of the memory management table. Alternatively, only a part of the memory management table is produced and the host device is notified of the canceling of the busy state. After that, until the host device issues a process request, or when the host device is issuing a process request, an incomplete part of the memory management table is completed. Thus, the memory management table can be completed.

Memory management table producing method and memory device

Data transferred from a host computer to a memory device is written into sectors whose addresses in a memory area are decoded by a decode tab. Old data to be updated by the above data is erased or marked with erase flags. At a predetermined point of time, in order to create free areas, necessary data is evacuated to a primary memory media and unnecessary data indicated by erase flags is erased by a unit of predetermined memory size. Part of the memory media which has become defective is marked with a defect flag, and is replaced by an alternate area. In doing so, the decode table is rewritten to rearrange the memory area.

Data transferred from a host computer to a memory device is written into sectors whose addresses in a memory area are decoded by a decode table. Old data to be updated by the above data is erased or marked with erase flags. At a predetermined point of time, in order to create free areas, necessary data is evacuated to a primary memory media and unnecessary data indicated by erase flags is erased by a unit of predetermined memory size. Part of the memory media which has become defective is marked with a defect flag, and is replaced by an alternate area. In doing so, the decode table is rewritten to rearrange the memory area.

Method of writing, erasing, and controlling memory and memory device

A clock circuit which selectively outputs a clock signal of a frequency equal to an integer multiple of a frequency of a master clock signal includes a setting circuit which sets a value corresponding to a target frequency of the clock signal, a counting circuit which counts pulses of the master clock signal, and an extracting circuit which extracts a pulse of the master clock signal each time a counter value of the counting circuit becomes equal to the value set by the setting circuit.

Clock switch circuit

Simultaneously writing to and erasing two commonly numbered sectors

A buffer section, a data holding section and a data selector are connected between memories. When multiple bus lines are to be used, for example, the data selector selects those bus lines where desired data is present, after which the data is held in the data holding section and desired timing adjustment is performed by the buffer section to cope with a timing deviation.

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Yokohama, Japan

Shogo Shibazaki