Shenzhen China Star Optoelectronics Technology Co., Ltd.

Shiue-shih Liao

Mingfeng Deng

Songxian Wen

Yizhuang Zhuang

Jungmao Tsai

Xiao-xin Zhang

Jung-mao Tsai

Junjie Huang

Chun-jiang Li

The present invention provides a testing device and a testing method. The testing method comprises: providing a testing device; bonding at least one connecting terminal of the testing device to signal lines of the display panel; and inputting test signals to the signal lines of the display panel through at least one test contact of the testing device. In the present invention, it is not required to arrange shorting bars on the display panel.

Testing device and testing method for display panels

A virtual load board includes a connection port, a conversion circuit, and an indication unit, wherein the connection port comprises at least one terminal. The terminal receives an output voltage from the liquid crystal display control board. The conversion circuit converts the output voltage into an operating voltage for the indication unit and supplies the operating voltage to the indication unit. A test system and a test method for liquid crystal display control board are also provided. With the above-discussed arrangement, the virtual load board replaces a liquid crystal display panel to carry out a reliability test of the liquid crystal display control board, and has the advantages of small volume and low cost and can be accommodated, together with the liquid crystal display control board, in reliability test equipment in order to carry out a reliability test of the liquid crystal display control board in a specific environment.

Virtual load board and test system and test method for liquid crystal display control board

A wiring structure of a wiring area on a liquid crystal displaying panel includes a number of wiring lines connected to one end of a corresponding data line and corresponding scan line on the wiring area, at least one signal testing point, a number of first testing lines connected between the wiring lines and the signal testing point, a number of second testing lines connected between the signal testing point and the other end of the corresponding data line and the corresponding scan line, and a switch controlling circuit connected to the second testing lines. After the testing lines are disconnected from the wiring lines in the previous process, the testing signal still can be transmitted through the other end of the corresponding data line or the scan line, to implement the image test of the liquid crystal displaying panel.

Wiring structure of wiring area on liquid crystal displaying panel and testing method of liquid crystal displaying panel

A TFT-LCD array substrate includes a display area, a peripheral area located at a periphery of the display area, and a connecting device. Wherein, the display area includes a plurality of data lines and gate lines. The peripheral area provides with a first test short bar provided with a plurality of data test lines for transmitting a test signal for the data lines, and a second test short bar provided with a gate test line for transmitting a test signal for the gate lines. The connecting device includes a first connection layer and a second connection layer. The connecting device is disposed at a connection location between one of the data test lines and one of the data lines, or between the gate test line and one of the gate lines. A test method for testing the TFT-LCD array substrate is also provided.

TFT-LCD array substrate having a connecting device for testing twice and test method for the same

A device for panel reliability testing and method thereof are proposed. The device includes a connection module, for connecting the panel and an aging module; a reliability chamber control module for sending a voltage regulation command to a bias module and/or a switch control command to the aging module; the bias module, for regulating voltage and transmitting information about voltage regulation to the aging module; and the aging module, for performing an aging operation on the panel depending on the switch control command sent from the reliability chamber control module and the information about voltage regulation transmitted from the bias module. Compared with the prior art, LCD panels undergo the aging testing before being packaged, thereby shortening a time period of manufacturing LCD panels and enhancing production efficiency.

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Shenzhen, China

Shiue-shih Liao