Canon Kabushiki Kaisha

Shiro Higashikozono

Yasushi Takeuchi

Yusuke Ishida

Takanori Iida

Toshiyuki Yamada

Nagato Osano

Toshiya Kobayashi

Hiroto Kakinuma

Koji Suzuki

Susumu Ito

Hirofumi Miyaki

A developing device includes a developing container, a developing sleeve, a magnet and grooves provided at a surface of the sleeve and formed along a direction crossing a circumferential direction of the sleeve. In a cross-section, each of the grooves is formed by a flat bottom portion contacting a carrier particle and a pair of side surface portions provided in both sides of the flat bottom portion with respect to the circumferential direction of the sleeve and satisfies the following relationship:&#x3c;22&#xd7;, and/2&#x2264;&#x3c;2 In the above, r is a volume-average particle size of the carrier particles, w is a length of the flat bottom portion, L is a width between the side surface portions at the surface of the sleeve, and s is a depth of each of the grooves.

Developing device

A developing device includes a developing container, a developing sleeve, a magnet and grooves provided at a surface of the sleeve and formed along a direction crossing a circumferential direction of the sleeve. In a cross-section, each of the grooves is formed by a flat bottom portion contacting a carrier particle and a pair of side surface portions provided in both sides of the flat bottom portion with respect to the circumferential direction of the sleeve and satisfies the following relationship:22&#xd7;and2&#x2266;&#x3c;2 In the above, r is a volume-average particle size of the carrier particles, w is a length of the flat bottom portion, L is a width between the side surface portions at the surface of the sleeve, and s is a depth of each of the grooves.

A light deflector for p-polarized light of wavelength .lambda. includes a light deflector member of a material principally composed of an aluminum allow with an aluminum oxide file, formed on the deflecting reflection face(s) of the light deflector member. Optical film thickness (nd) of the aluminum oxide film is within a range of:

Light deflector

Disclosed are a method and an apparatus for forming a specular protective film in which the intensity of reflected light is made even with a variation in the angle of incidence of the incident light. In the anodic oxidation treatment, the current value applied to a plurality of specular parts is sampled at a predetermined interval (S301), and each sampled value is integrated over time (S302) and the average value is obtained. A comparison is made between an obtained average value and a preset value, and if the average value is greater, the application of current to all the specular parts is stopped (S303). The preset value is the amount of electricity conducted to form an anodic oxide film having a film thickness corresponding to a desired reflectance which is determined from the relation between the preset film thickness of anodic oxide film and the reflectance. Also, a process for checking to see whether or not the voltage produced by applying the current to each specular part at the start of anodic oxidation treatment is at a predetermined rise slope (S304 to S310), and a process for correcting the current applied to each specular part so as to be equal to the average value during the anodic oxidation treatment are provided (S311 to S315).

Growing community of inventors

Tsukuba, Japan

Shiro Higashikozono