Roche Diagnostics Operations, Inc.

Shirin Shahriari

Anton Hilger

Daniel Intelmann

Andrea Geistanger

Nadja Arens

A method for calibrating at least one mass spectrometry device having a first defined hardware configuration comprises at least one manufacturer-site pre-calibration step establishing at least one reference calibration function ffor a generic type of mass spectrometry devices having a second defined hardware configuration, wherein the second defined hardware configuration is equivalent to the first defined hardware configuration, wherein the reference calibration function fdescribes a relationship of at least one concentration c of at least one analyte in at least one calibrator sample, wherein the reference calibration function fis a parametrized function f(concentration), with p=(p,p, . . . p) being a set of parameters of the reference calibration function and n being a positive integer; determining calibration values {circumflex over (p)}=({circumflex over (p)},{circumflex over (p)}, . . . {circumflex over (p)}) for the set of parameters of the reference calibration function for the generic type of mass spectrometry devices.

Method for calibrating at least one mass spectrometry device

A method for calibrating at least one analytic device with repeated hardware components is disclosed and comprises providing at least one calibrator sample i having a known target value of a concentration of at least one analyte; at least one measuring step, wherein the measuring step comprises conducting at least one measurement on the calibrator sample using the analytic device, wherein at least one detector signal sis acquired; at least one calibration step, wherein a relationship between the detector signal and the concentration of the analyte and/or between the detector signal and a theoretical signal value is determined, wherein the calibration step comprises providing at least one parametrized function; determining calibration values by conducting a calibration based on the parametrized function; and determining an analysis function on basis of an inverse of the parametrized function and the determined calibration values.

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Munich, Germany

Shirin Shahriari