Growing community of inventors

Tokyo, Japan

Shinya Yamada

Average Co-Inventor Count = 1.28

ph-index = 2

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 7

Shinya YamadaYuji Takagi (1 patent)Shinya YamadaMaki Tanaka (1 patent)Shinya YamadaChie Shishido (1 patent)Shinya YamadaHiroaki Yokota (1 patent)Shinya YamadaTakuma Yamamoto (1 patent)Shinya YamadaKengo Ogawa (1 patent)Shinya YamadaSeiga Karaki (1 patent)Shinya YamadaShinya Yamada (11 patents)Yuji TakagiYuji Takagi (98 patents)Maki TanakaMaki Tanaka (93 patents)Chie ShishidoChie Shishido (82 patents)Hiroaki YokotaHiroaki Yokota (67 patents)Takuma YamamotoTakuma Yamamoto (47 patents)Kengo OgawaKengo Ogawa (5 patents)Seiga KarakiSeiga Karaki (1 patent)
..
Inventor’s number of patents
..
Strength of working relationships

Company Filing History:

1. Canon Kabushiki Kaisha (5 from 90,594 patents)

2. Sumitomo Chemical Company, Limited (2 from 6,892 patents)

3. Hitachi-high-technologies Corporation (2 from 2,874 patents)

4. The Japan Steel Works, Ltd. (1 from 405 patents)

5. Sumitomo Chemical Companylimited (1 from 17 patents)


11 patents:

1. 11543574 - Wave plate, method for manufacturing wave plate, and optical apparatus

2. 11128461 - Encryption processing apparatus and encryption processing method

3. 10893676 - 1-acetyl-3-phenyl urea compound, and use thereof

4. 10844019 - 1-phenyl-3-carbamoyl urea compound, and use thereof

5. 10624343 - Phenyl urea compound, and use thereof

6. 9985780 - Hash value generating device that performs round processing of a hash algorithm

7. 9973336 - Hash value generating device

8. 9875362 - Hash value generation apparatus

9. 9852881 - Scanning electron microscope system, pattern measurement method using same, and scanning electron microscope

10. 9614667 - Information processing apparatus and method therefor

11. 9191628 - Pattern dimension measurement method, pattern dimension measurement device, program for causing computer to execute pattern dimension measurement method, and recording medium having same recorded thereon

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12/4/2025
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