Seiko Epson Corporation

Shinya Ukai

Akira Morita

An integrated circuit includes a capacitance element to be tested and a test circuit in the same semiconductor substrate, the test circuit includes a capacitance element for testing, and a comparison circuit for comparing a voltage of a node with a voltage of a signal, electrically connects another end of the capacitance element to be tested to the node, applies the voltage of the signal to the node in a first period, changes the voltage of the node based on a capacitance ratio of the capacitance element to be tested and the capacitance element for testing, and tests a capacity size of the capacitance element to be tested based on a comparison result of the comparison circuit in a second period after the first period.

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Suwa-gun, Japan

Shinya Ukai