Nidek Co., Ltd.

Tatsuta Electric Wire & Cable Co., Ltd.

Ntdek Co., Ltd.

Shinya Iwata

Takayoshi Shibata

Masaaki Hanebuchi

Yukihiro Higuchi

Naho Murakami

Takuya Matsumoto

Michihiro Takii

Ryosuke Shiba

Masayuki Yoshino

Junpei Nishiyama

Tomohiro Miyagi

Hideki Aono

Masato Takaya

Megumi Tsuchiya

Hirofumi Yogo

Kenji Aoki

Provided are ophthalmologic image processing method, including an acquisition step of acquiring OCT data of an eye to be examined based on a spectral interference signal output from an OCT optical system, a setting step of setting a depth region including an image position of a tissue as an extraction region for data on one-direction side from a zero delay position in the OCT data, and a display control step of extracting extracted OCT data corresponding to the extraction region from the OCT data and displaying the extracted OCT data in a display region set in advance on a monitor, and an OCT apparatus that executes the method.

Ophthalmologic image processing method and OCT apparatus

A fundus imaging apparatus includes an imaging optical system that irradiates a fundus of a subject eye with light through an objective lens system, and enables to capture a fundus image of the subject eye based on return light from the subject eye, and a diopter correction unit that includes an optical element disposed on an optical path of the imaging optical system and a drive unit driving the optical element, and performs a diopter correction with a diopter value corresponding to a drive amount of the optical element. A drive range of the optical element in the diopter correction unit is set to avoid a specific range being a range in which an artifact caused by reflection light in the objective lens system is maximized.

Fundus imaging apparatus

An OCT system includes an OCT optical system and a reference attachment. The OCT optical system has a beam splitter for splitting light into a measurement optical path and a reference optical path, a photodetector, a first waveguide, a second waveguide, and first connectors provided at end portions of the first waveguide and the second waveguide respectively for indirectly or directly connecting the first waveguide and the second waveguide. The reference attachment has a third waveguide, and second connectors formed at both ends of the third wave guide and configured to be attachable to and detachable from the first connector, and is attached to and detached from the OCT optical system h attaching and detaching each of the second connectors to and from the first connector to change an optical path length of the reference optical path.

OCT system and reference attachment

A light interference unit includes a branching optical element, a multiplexing optical element, and at least one fiber device. The branching optical element branches a laser light with an emission wavelength temporally swept, into a measurement light and a reference light. The multiplexing optical element multiplexes the reference light and the measurement light reflected by a measured object, and causes them to interfere. The fiber device includes a reference light device. A transmission light path length is a light path length of the reference light transmitting the reference light device, from the reference light device to the multiplexing optical element. A reflection light path length is a light path length of the reference light reflected by a separation portion of the reference light device, from the reference light device to the multiplexing optical element. The transmission light path length is equal to or more than the reflection light path length.

Light interference unit and light interference measurement device

An ophthalmic surgical microscope includes an observation optical system configured to guide observation luminous fluxes for a right eye and a left eye from an observation object to an imaging device, an actuator configured to move a position of the observation optical system in at least a direction intersecting with the observation luminous fluxes, a processor, and a memory storing computer-readable instructions. The computer readable instructions, when executed by the processor, cause the ophthalmic surgical microscope to cause a stereoscopic image display to display an observation image to be observed with a right eye of a user and an observation image to be observed with a left eye of the user, detect a position of the observation object with respect to the observation optical system, and correct a deviation in a relative position of the observation optical system with respect to the observation object.

Ophthalmic surgical microscope

An ophthalmic laser surgical apparatus includes an XY scan unit, a light guiding optical element, an objective lens, and a Z scan unit. The XY scan unit includes a deflecting device for deflecting the pulsed laser beam, and scans the pulsed laser beam in a direction crossing an optical axis. The light guiding optical element is provided downstream of the deflecting device on the optical path of the pulsed laser beam. The light guiding optical element has refractive power, and guides the pulsed laser beam. The objective lens causes the pulsed laser beam through the XY scan unit and the light guiding optical element to converge in a tissue of a patient's eye. The Z scan unit varies the optical path length between the light guiding optical element and the objective lens while the objective lens is fixed in position on the optical path.

Ophthalmic laser surgical apparatus

An ophthalmic laser surgery apparatus for treating an eye of a patient includes: a laser light source configured to emit the pulse laser light; an objective lens configured to condense the pulse laser light emitted from the laser light source on the tissue to cause a photodistuption of the tissue; a scanner configured to scan a condensing position of the pulse laser light condensed by the objective lens; and a controller configured to control the scanner to adjust speed of scanning the condensing position depending on a size of the photodisruption which fluctuates in according to an aberration which fluctuates according to a change in the condensing position.

Growing community of inventors

Aichi, Japan

Shinya Iwata