Hoya Corporation

Rigaku Corporation

Komatsu Corporation

Shimizu Construction Co., Ltd.

Shinko Electric Company, Ltd.

Other

Nippon Steel Sumitomo Metal Corporation

Nisshin Engineering Inc.

Hoya Technosurgical Corporation

Tsuneo Okuyama

Shintaro Kobayashi

Hiroshi Harada

Tsutomu Ishida

Yoshiyuki Iwasawa

Takeshi Kamimae

Katsuhiko Inaba

Takeshi Watanabe

Toru Mitsunaga

Takashi Matsumoto

Nobuo Matsuyama

Yuki Arai

Muneo Harada

Tsutomu Shinya

Tomohiko Yoshitake

Kiwamu Yamamoto

Toshio Takasu

Shigeru Tanaka

Kazuhiko Omote

Takayuki Uchida

Yutaka Ono

Takuto Sakumura

Ladislav Pina

Taijiro Matsui

Hisashi Konaka

Koichi Kajiyoshi

Kazuhiro Yubuta

Adolf Inneman

Hiroshi Imagawa

Masashi Yoshimura

Hatsuo Taira

Yasukazu Nakae

Shingo Umeda

Yasutaka Sakuma

Kazuyoshi Arai

Naomi Masuzawa

The present invention provides that powder is mainly constituted from secondary particles of hydroxyapatite. The secondary particles are obtained by drying a slurry containing primary particles of hydroxyapatite and aggregates thereof and granulating the primary particles and the aggregates. A bulk density of the powder is 0.65 g/mL or more and a specific surface area of the secondary particles is 70 m/g or more. The powder of the present invention has high strength and is capable of exhibiting superior adsorption capability when it is used for an adsorbent an adsorption apparatus has.

Powder, method of producing powder and adsorption apparatus

A controller controls a first drive source and a second drive source based on a rotation speed of a right rear wheel measured by a rotation speed sensor and a rotation speed of a left rear wheel measured by a rotation speed sensor, to thereby independently control a rotation speed of each of a right front wheel and a left front wheel.

Work machine and method of controlling the same

A controller controls a first drive source and a second drive source based on a moving speed of a motor grader measured by a speed sensor and a turning angular velocity of the motor grader measured by an IMU, to thereby independently control a rotation speed of each of a right front wheel and a left front wheel.

[Problems] To provide a column-use adsorbent having an excellent balance of adsorption capacity and durability, and an adsorption apparatus. [Means to solve problems] A column-use adsorbent made of powder of a porous particle group of hydroxyapatite or fluoroapatite formed by replacing at least part of a hydroxyl group of hydroxyapatite with fluorine atom, the porous particle group being a group of a plurality of porous particles having different particle sizes, the porous particle group meeting the condition of D&#xd7;45/100&#x2264;D&#x2264;D&#xd7;75/100, in which D(&#x3bc;m) is an average particle size, and D(&#x3bc;m) is a particle size at which a cumulative volume of the porous particles from the small size side based on a particle size distribution is 10%.

Adsorbent and adsorption apparatus

There is provided a control apparatusthat controls a tilt of a sample, the control apparatus comprising an input sectionthat receives an input of inclination information representing inclination of the sample with respect to a &#x3d5; axis; an adjustment amount determination sectionthat determines adjustment amounts of a &#x3c9; value and a &#x3c7; value for correcting a deviation amount between a scattering vector and a normal line to a sample surface or a lattice plane with respect to a &#x3d5; value that varies, using the inclination information; and a drive instruction sectionthat drives a goniometer according to &#x3d5; axis rotation of the sample, based on the determined adjustment amounts of the &#x3c9; value and the &#x3c7; value, during an X-ray diffraction measurement.

Control apparatus, system, method, and program

There are provided a storage sectionthat stores an output value read out by counting a pulse signal of incident X-rays, by a photon-counting type semiconductor detector; and a calculation sectionthat calculates a count value based on the output value that has been read out, wherein the calculation sectionuses a model in which an apparent time constant of the pulse signal monotonously decreases against increase in pulse detection ratio with respect to exposure. According to such a model, the corresponding apparent time constant is able to be obtained even in any higher count rate. As a result of this, reduced can be the influence of count loss even on the count rate that has not been able to be covered by the conventional method.

Processing apparatus, sysyem, X-ray measurement method, and program

An X-ray diffraction apparatus having a solar slit, and a method for preventing the diffraction image on a detector from spreading in the in-plane direction even when an X-ray irradiation region spreads over the sample surface due to measurement by GIXD, thereby allowing for measurement with a short measurement time and a high resolution. The soller slitincludes a plurality of metallic thin plates, each being perpendicular to the bottom surface, which are arcuately arranged with a predetermined angular interval between each other so as to pass X-rays in a radiating direction from a particular focus, the soller slit being provided to be used at a position through which X-rays diffracted on a sample surface pass, the particular focus being the center of a goniometer circle, the X-rays being irradiated on a sample at an angle for GIXD.

Soller slit, X-ray diffraction apparatus, and method

To provide an X-ray analysis device and a method for optical axis alignment thereof by which measurement time is shortened and measurement cost may be reduced without optical axis alignment at each measurement using an analyzer. The X-ray analysis device includes a sample stage for supporting a sample, an N-dimensional detector, and an analyzer including analyzer crystals. A detection surface of the N-dimensional detector has first and second detection areas, a plurality of optical paths includes a first optical path that directly reaches the first detection area and a second optical path that reaches via the analyzer crystals, and the N-dimensional detector performs a measurement of the first optical path by X-ray detection of the first detection area, and performs a measurement of the second optical path by X-ray detection of the second detection area.

X-ray analysis device and method for optical axis alignment thereof

A work vehicle includes a blade, a shutter, a notification unit, and a controller. The blade includes a lower end. The shutter is attached to the blade. The shutter can be alternatively disposed at a first position at which the shutter protrudes forward from the lower end of the blade or at a second position at which the shutter is farther away from the lower end than at the first position. The notification unit is configured to notify surroundings of the work vehicle about information of the work vehicle. The controller is configured to change information notified by the notification unit in accordance with an arrangement of the shutter at one of the first position and the second position.

Work vehicle

A work vehicle allowing a simplified operation to open and close a shutter in a simple configuration is provided. The shutter can be disposed alternatively at a first position at which the shutter protrudes forward from a lower end of a blade or at a second position at which the shutter is farther away from the lower end than at the first position. The controller is configured to receive an input of an operation instruction from an input operation unit for moving the shutter from the second position to the first position, to cause the shutter to move from the second position to the first position. After a lapse of a prescribed time period since the shutter is moved to the first position, the controller causes the shutter to move from the first position to the second position.

Powder, method of producing powder, and adsorption apparatus

An X-ray diffractometer for obtaining X-ray diffraction angles of diffracted X-rays by detecting with an X-ray detector diffracted X-rays diffracted at a sample when X-rays are emitted at the sample at each angle of the angles about a center point of goniometer circles, the X-ray diffractometer having a pinhole member provided with a pinhole, the pinhole allowing X-rays diffracted from the sample to pass so that the diffracted X-rays pass through the center point of the goniometer circle, and other diffracted X-rays are shielded by the pinhole member.

X-ray diffractometer

Growing community of inventors

Tokyo, Japan

Shintaro Kobayashi