Mitsubishi Electric Corporation

Shinsuke Idenoue

Satoshi Ishibashi

Masaru Kobayashi

Junichi Abe

Satoshi Ishii

Toshio Watanabe

Hirotoshi Maekawa

Kazuhiko Otsuka

Matahiko Ikeda

Takeshi Oi

Takeshi Horiguchi

Shinichi Kinouchi

Seiji Haga

Hiroshi Nakatake

Shigenobu Tochiyama

Masayoshi Tamura

Takao Mitsui

Naoki Moritake

A liquid coolant supplying header is configured on a central portion in the width direction between an upper portion heatsink and a partitioning plate, a liquid coolant discharging header is configured on a central portion in the width direction between a lower portion heatsink and the partitioning plate so as to be parallel to the liquid coolant supplying header, vertical flow channels are formed so as to pass through the partitioning plate vertically on two sides in the width direction so as to be parallel to the liquid coolant supplying header, a liquid coolant distributing structural body is disposed inside the liquid coolant supplying header, and an external shape of the liquid coolant distributing structural body is formed such that flow channel cross-sectional area of the liquid coolant supplying header becomes gradually smaller from an upstream end toward a downstream end.

Cooling apparatus having vertical flow channels

A power conversion device provided with a DC power source, a voltage boost converter, an inverter, a primary smoothing capacitor, a secondary smoothing capacitor, an intermediate capacitor provided in the voltage boost converter and three voltage sensors which measure the voltages of the capacitors, further including an abnormality diagnosis controller which makes a diagnosis of the presence/absence of an abnormality in the detection characteristics of the voltage sensors, on the basis of the state of transition of the detection results of the voltage sensors which are monitored during a discharge operation by the respective capacitors.

Power conversion device and method for diagnosing abnormality in voltage sensor characteristics

A power converter has one set of two semiconductor switches performing switching actions, each of which is formed of an FET and a free wheel diode connected in anti-parallel to the FET, and a smoothing capacitor, and convers power by complementary switching actions of the FETs in the semiconductor switches. The power converter is provided with a current sensor that detects a direction of a current flowing through the semiconductor switches and a gate generation portion that skips ON signals of PWM gate signals of the semiconductor switches when the direction of the current flowing through the semiconductor switches is negative.

Power converter using a field effect transistor and a diode

In a power converter in which semiconductor modules are arranged on both surfaces of a cooler for downsizing, an excellent connection between control boards and a low inductance connection between smoothing capacitors and the semiconductor modules are performed at the same time. The semiconductor modules are disposed on both surfaces of the cooler, and control boards that control the semiconductor modules are arranged opposite to the respective semiconductor modules. The semiconductor modules and the cooler are held between the control boards. A current detector or a terminal block is disposed at a position perpendicular to a surface on which the cooler and the semiconductor modules contact each other, opposite to the cooler. The respective control boards disposed on both surfaces of the cooler are electrically connected by using wirings provided in the current detector or the terminal block.

Power converter

A drive circuit wherein any abnormality of a semiconductor element is prevented from being erroneously sensed in a case where a gate 'ON' command has entered in a state in which a gate voltage of the semiconductor element has not lowered fully. A detection process for a controlled variable of the semiconductor element is permitted only within a period which corresponds to a controlled variable of the semiconductor element at the time when an 'ON' signal has been inputted to a control circuit, and a detected controlled variable which is detected within the period and a comparison controlled variable which is set in correspondence with the controlled variable are compared so as to output an abnormality signal, whereby the semiconductor element is turn-off at a speed lower than in normal turn-off.

Drive circuit for semiconductor element

Growing community of inventors

Tokyo, Japan

Shinsuke Idenoue