Sony Corporation

Autodesk, Inc.

Kabushiki Kaisha Square Enix

Shinji Ogaki

Hiroaki Ono

Mitsuharu Ohki

Yusuke Tokuyoshi

Iliyan Georgiev

A computer-implemented method and system provide the ability to draw a feature line on an image. An image is acquired and is represented as a set of pixel samples for every pixel in the image, with each pixel sample including one or more feature attributes. One or more features are detected based on differences between the feature attributes. The detected features are represented by pixel samples. A color of the pixel samples representing the detected features is altered. The image is rendered based on the pixel samples including the altered color, and the feature line includes the altered color.

Production ray tracing of feature lines

A shading method and computer graphics system are provided in which a path of light is reflected at a given object from a virtual light source. The path of light reaches a given eye point is sampled. A distribution function for a surface of the object is obtained using the sampled path of light, and arithmetic processing is performed such that a maximum value of the distribution function is less than or equal to a predetermined value. In this regard, an estimated specular roughness of the surface of the object is obtained by setting the distribution function to be less than or equal to the predetermined value.

Real-time global illumination rendering system

A product identification apparatus for determining whether an inspection target product to be identified is the same as a predetermined verification product includes: an extraction unit configured to extract an input pattern formed of asperities on the surface of a predetermined part of the inspection target product from a captured image obtained by capturing the image of the predetermined part of the inspection target product; and a comparison unit configured to compare the input pattern with an identification pattern extracted from a captured image obtained by capturing in advance the image of a part of the verification product so as to determine whether the input pattern is the same as the identification pattern or the input pattern includes the identification pattern.

Growing community of inventors

Tokyo, Japan

Shinji Ogaki