Hiroshima University

Satake Corporation

Shinji Kaya

Hiroki Ishizuki

Hideaki Ishizu

Kensuke Kawamura

A kernel component analysis device quantitatively analyzing a specific component contained in each of kernels on a kernel-by-kernel basis by spectroscopy includes: a light emitter configured to irradiate a kernel to be analyzed with light; a spectrum detector configured to detect a spectrum of light transmitted through and/or reflected from the kernel irradiated with the light; and a computing unit configured to calculate, on a kernel-by-kernel basis, a content of the specific component in the kernel to be analyzed, based on a spectrum value detected from an effective portion, which is suitable for quantitative analysis, of an image of the kernel by using a calibration curve indicating a relationship between a spectrum value at a specific wavelength and a content of the specific component.

Growing community of inventors

Tokyo, Japan

Shinji Kaya