Fujitsu Corporation

Shinichiro Uekusa

Yasuo Kouzaki

Yasuo Kousaki

A semiconductor device includes: a substrate; a semiconductor chip mounted over the substrate and having a solder bump coupled by soldering with an electrode over the substrate; and a heating unit for locally generating heat in a corner part within the horizontal plane of the semiconductor chip when an operating temperature of the semiconductor chip is equal to or less than a prescribed temperature.

Semiconductor device and electronic device

The method comprises a number of simultaneously switching signals calculation step in which the number of simultaneously switching signals is calculated for each set of user setting information for the input and output signal on the basis of pin arrangement information and the user setting information of the pins in a neighboring area of a pin to be executed in the estimation process; and a simultaneous switching noise calculation step in which a difference is calculated between noise corresponding to an initial point and that to a terminal point in a range of the number of simultaneously switching signals calculated for each set of user setting information on the basis of a relationship between the number of simultaneously switching signals and the noise caused by the number of simultaneously switching signals for each set of user setting information.

Method and device for estimating simultaneous switching noise in semiconductor device, and storage medium

In an initial stage of device design, a circuit analysis control unit of an evaluation board stores SSO noise basic characteristic data actually measured by the evaluation board in an SSO noise basic characteristic data storage unit, and an SSO noise calculation unit calculates a rough amount of SSO noise on the basis of the SSO noise basic characteristic data. After a noise check is OR, the design proceeds, and a PCB parameter is determined, a circuit analysis control unit acquires the SSO noise basic characteristic data according to actual device PCB design information, and corrects the SSO noise basic characteristic data in the SSO noise basic characteristic data storage unit. Then, the SSO noise calculation unit performs a detailed analysis of an amount of SSO noise using the corrected SSO noise basic characteristic data.

Method for acquiring basic characteristic of simultaneous switching noise in method for estimating simultaneous switching noise on semiconductor device

Growing community of inventors

Kawasaki, Japan

Shinichiro Uekusa