Shimadzu Corporation

Shinichiro Totoki

Kenji Takubo

Yukihisa Wada

Naoji Moriya

Haruo Shimaoka

Kikuo Okuyama

Yoshio Tsunazawa

Yuzo Nagumo

Fujio Inoue

Motoaki Adachi

Naofumi Sakauchi

Masahiro Takebe

Akihiro Fukai

Michio Higuchi

c/o Shimadzu Corporation Corporation

In order for a parallel light beam to enable formation of an image at the center of a photodetectorwithout the use of an actuator for the adjustment by an order of micrometers, a particle size distribution measuring apparatusis provided with: a control unitfor calculating the distribution of particle size; a lenswhich is located between a light source unitand a cell baseand has an entrance planeand an exit planethat is not parallel to the entrance plane; and a lens drive mechanismthat can rotate the lensfor adjusting the optical axis so that the angle at which the parallel light beam enters into the entrance planecan be changed, wherein a detecting surfacefor adjusting the optical axis is formed on a photodetector

Particle size distribution measuring apparatus

A distribution of AC electric field regularly arranged in a cell is formed while storing a sample having particles dispersed in a medium in the cell, whereby the particles are dielectrically migrated in the medium to generate a diffraction grating by density distribution of the particles. Diffracted light generated by irradiating the diffraction grating by density distribution with measuring light is detected, and evaluation of dielectrophoretic intensities of the particles and/or the medium is performed from the detection result. According to this method, evaluation of dielectrophoretic characteristics can be performed without adhering a phosphor to particles, and since even a particle small in size can achieve a detection level by collecting a number of such particles to form a diffraction grating, dielectric characteristics of microparticles of several nanometers in diameter can be thus quantitatively measured with high sensitivity.

Method and apparatus for evaluating dielectrophoretic intensity of microparticle

The present invention relates to an optical measuring device which includes container for storing a sample, and an electrode pair for generating an electric field distribution upon impression of a voltage by an electrical power supply, thereby generating or extinguishing diffraction grating formed by a density modulation of particles within the sample. The particles within the sample are evaluated based upon a temporal change of an intensity of a diffracted light beam obtained by irradiating a light beam upon the diffraction grating formed by the density modulation of the particles. The electrodes constituting the electrode pair are configured to have a comb-like electrode teeth that are parallel with each other and are arranged such that the electrode teeth of one electrode are inserted between the electrode teeth of the other electrode. From such configuration, an optical measuring device of a high sensitivity and excellent S/N ratio can be obtained.

Optical measuring device

A laser diffraction particle size analyzer irradiates a laser beam on particles in a scattered state, and measures a spatial intensity distribution of diffracted and scattered light from the particles. A particle size distribution of the particles is calculated from a result of the measurement. The laser diffraction particle size analyzer includes a laser device for generating an ultraviolet laser beam as a light source for generating a laser beam, and a fluorescent member closely attached to or disposed adjacent to a detecting surface of a photodiode array that measures the spatial intensity distribution of the diffracted and scattered light upon incidence thereof.

Particle size analyzer

An apparatus analyzes components of particulate materials suspended in air. The apparatus includes a container into which the air is introduced, a discharging electrode arranged in the container to electrically charge the particulate materials contained in the air, a dust collecting electrode arranged in the container to collect charged particulate materials utilizing electric potential difference, and a device for separating volatile components contained in the particulate materials collected on the dust collecting electrode. A gas analyzer is connected to the container into which the volatile components of the particulate materials separated in the container are introduced, to analyze the volatile components.

Suspended particulate analyzer

In a method of measuring particles floating in an atmosphere, the atmosphere containing the particles is sucked into a container, ions are generated from a discharge electrode disposed in the container to charge the particles with the ions. A dust-collecting electrode is arranged in the container to electrically conduct with a ground potential, wherein the dust collecting electrode is formed of a transparent plate having a transparent conductive film on a surface thereof facing the discharge electrode. The charged particles are collected on the dust-collecting electrode disposed in the container by using a potential difference relative to the discharge electrode, and the particles on the dust-collecting electrode are measured.

Method of measuring floating dusts

A collecting device for collecting particles floating in the atmosphere includes a collecting container; a pump for sucking the atmosphere into the collecting container; a discharge electrode disposed in the collecting container for generating single polarity ions to charge the particles in the collecting container; and a dust-collecting electrode for collecting the charged particles in the collecting container through a potential difference between the discharge electrode and the dust-collecting electrode. The dust on the dust-collecting electrode is measured and analyzed.

Collecting apparatus of floating dusts in atmosphere

Particulate collector is carried onto airplane and collects suspended particulate matter in the atmospheric air in such a manner that suspended particulate matter is electrically charged by single-pole ions generated by a discharge electrode and the thus electrically charged particulates are attracted to a collecting electrode having an electric potential difference with respect to the discharge electrode so that the particulates are collected by the collecting electrode. The particulate collector is conveyed to an arbitrary altitude and driven so as to collect suspended particulate matter contained in the atmospheric air at the arbitrary altitude. Particulate collector is recovered onto the ground so as to make various measurements or the thus collected particulate collector is subjected to various measurements on airplane.

Method for measuring suspended particulate matter in atmospheric air

A collecting device for collecting suspended particles includes a mobility analysis device; a collecting container connected to an outlet of the mobility analysis device; a discharge electrode disposed inside the collecting container for charging the particles inside the collecting container by generating single polar ions; and a collecting electrode for collecting the charged particles inside the collecting container by an electric potential difference relative to the discharge electrode. In the mobility analysis device, the particles are charged and guided into a flow path. An electric field is created in the flow path, and the particles are guided into the path perpendicular to the electric field. Since a mobility of a particle in an electric field depends on a size of the particle, the particles guided in the path are separated according to the electric field, thereby obtaining particles with sizes in a specific range.

Collecting device for suspended particles

Suspended particulate matter in the atmospheric air is sucked into a container by a pump. The suspended particulate matter in the atmospheric air in the container is electrically charged so as to electrically collect it. The collected suspended particulate matter is irradiated with laser beams under the condition that the collected suspended particulate matter is dispersed at an appropriate concentration. A spatial intensity distribution of diffracted and scattered light obtained by irradiating laser beams to the suspended particulate matter is measured. A particle size distribution of the suspended particulate matter P is found from the result of measurement.

Growing community of inventors

Kyoto, Japan

Shinichiro Totoki