Hamamatsu-photonics K.k.

Hamamatsu Photonics Kabushiki Kaisha

Other

Shinichiro Aoshima

Yutaka Tsuchiya

Hironori Takahashi

Tsuneyuki Urakami

Takuya Nakamura

Isuke Hirano

Masatoshi Fujimoto

Kenshi Fukumitsu

Yoichi Kawada

Haruyasu Ito

Takashi Yasuda

Shingo Oishi

Makoto Hosoda

Tamiki Takemori

Hideo Suzuki

Musubu Koishi

Koei Yamamoto

Atsushi Nakanishi

Tomonori Kawakami

Hiroshi Kumagai

Mitsuo Hiramatsu

Katsumi Midorikawa

Shigeru Sakamoto

Yoshiharu Ooi

Mutsuji Takahashi

Iakuya Nakamura

Toshiharu Moriguchi

Hiroe Sato

Masaru Matsui

The present invention provides an optical amplifying device which can be easily downsized, increased in output, and stabilized. An optical amplifying deviceA includes an optical amplifierA and an energy supplier. The optical amplifierA includes an optical amplifying mediumand a transparent medium. The energy suppliersupplies excitation energy (for example, excitation light) to the optical amplifying medium. The optical amplifying mediumis supplied with the excitation light to amplify light and output it. To-be-amplified light passes through the transparent mediumin the optical amplifying mediuma plurality of times. The transparent mediumcan propagate the to-be-amplified light, for example, zigzag inside.

Optical amplifying device

A cylindrical lens () diverges a laser beam (L) in the Y-axis direction (i.e., within the YZ plane) but neither diverges nor converges it in the X-axis direction (i.e., within the ZX plane). An objective lens () converges the laser beam (L) emitted from the cylindrical lens () into a point Pin the Y-axis direction and into a point Pin the X-axis direction. A pair of knife edges () adjust the divergence angle (&#x3b8;) of the laser beam (L) incident on the objective lens () in the Y-axis direction. As a consequence, the cross section of the laser beam (L) becomes an elongated form extending in the Y-axis direction at the point Pwhile the maximum length in the Y-axis direction is regulated. Therefore, locating the point Pon the front face of a work (S) can form an elongated working area extending in the Y-axis direction by a desirable length on the front face of the work (S).

Laser beam working machine

A cylindrical lens () diverges a laser beam (L) in the Y-axis direction (i.e., within the YZ plane) but neither diverges nor converges it in the X-axis direction (i.e., within the ZX plane). An objective lens () converges the laser beam (L) emitted from the cylindrical lens () into a point Pin the Y-axis direction and into a point Pin the X-axis direction. As a consequence, the cross section of the laser beam (L) becomes elongated forms extending in the X- and Y-axis directions at the points P, P, respectively. Therefore, when the points P, Pare located on the outside and inside of the work (S), respectively, an elongated working area extending in the Y-axis direction can be formed in a portion where the point Pis positioned within the work (S).

A single terahertz wave time-waveform measuring deviceacquires information on an object to be measuredby using a terahertz wave, and includes a light source, a beam diameter adjuster, a separator, a terahertz wave generator, a light path length difference adjuster, a pulse front tilting unit, a polarizer, a wave synthesizer, an electro-optic crystal, an analyzer, and a photodetector. The terahertz wave generatorgenerates a pulse terahertz wave in response to an input of pump light and outputs the pulse terahertz wave. The pulse front tilting unitmakes pulse fronts of the terahertz wave and the probe light when being input into the electro-optic crystalnonparallel to each other by tilting the pulse front of the probe light.

Single terahertz wave time-waveform measuring device

A total reflection terahertz wave measuring apparatusincludes a light source, a branching part, a chopper, an optical path length difference adjusting part, a polarizer, a beam splitter, a terahertz wave generating element, a filter, an internal total reflection prism, a terahertz wave detecting element, a &#xbc; wavelength plate, a polarization split element, a photodetector, a photodetector, a differential amplifier, and a lock-in amplifier. The internal total reflection prismis a so-called aplanatic prism, and has an entrance surface, an exit surface, and a reflection surface. The terahertz wave generating elementand the filterare provided to be integrated with the entrance surfaceof the internal total reflection prism, and the terahertz wave detecting elementis provided to be integrated with the exit surfaceof the internal total reflection prism. The filterallows a terahertz wave to be transmitted therethrough and blocks pump light. Accordingly, a total reflection terahertz wave measuring apparatus, which can be downsized, can be realized.

Total reflection terahertz wave measurement device

A total reflection terahertz wave measuring apparatusis configured to acquire information on a subject S by a total reflection measurement method by use of a terahertz wave, and includes a light source, a branching part, a chopper, an optical path length difference adjusting part, a polarizer, a separator, a terahertz wave generating element, an internal total reflection prism, a terahertz wave detecting element, a &#xbc; wavelength plate, a polarization split element, a photodetectorA, a photodetectorB, a differential amplifier, and a lock-in amplifier. The internal total reflection prismis a so-called aplanatic prism, and has an entrance plane, an exit plane, and a reflection plane. The terahertz wave generating elementis provided to be integrated with the entrance planeof the internal total reflection prism, and the terahertz wave detecting elementis provided to be integrated with the exit planeof the internal total reflection prism

Total reflection tera hertz wave measuring apparatus

In an imaging apparatus, a detection sectiondetects a beam Lhaving passed through an aperturein a first direction and a location designation beam Lhaving passed through the aperturein the opposite direction is made incident to a position (x,y) in a first light image IMon an image pickup surface corresponding to a specific position (x,y) in a second light image IMwhereby the result of detection of the beam Ldetected at the detection sectionindicates data at a specific position in an incoming light image designated by the location designation beam L, regardless of whether there is a mechanical error in movement of the aperture

Image pickup device

A light pulse from an ultrashort pulse light sourceis split by a beam splitterand guided, to a detection medium, as an excitation pulse and probe pulse having respective predetermined linearly polarized states by an excitation optical systemand probe optical system, respectively. A light track region which is generated in the detection mediumby incidence of the excitation pulse, and in which the refractive index is changed by a nonlinear optical effect, is irradiated with the probe pulse. Of components which have passed through the detection medium, a probe pulse component whose polarized state has changed through the light track region is detected by a cameravia an analyzerin a photodetection part. This realizes a light track observation apparatus capable of directly observing the light track of an excitation pulse.

Light track observing device

A fluorescence component that passes through a region of a detection medium where a change in refractive index has been induced through a nonlinear optical effect produced in the detection medium by a gate pulse is observed as a fluorescence image by utilizing a change in polarization state. By observing the change in position of the fluorescence image while correlating with the change over time in the fluorescence, a fluorescence lifetime measuring apparatus is realized with which the change over time in the fluorescence, in particular the fluorescence lifetime, can be measured efficiently with high temporal resolution.

Instrument for measuring lifetime of fluorescene

The transparent medium processing device comprises: a light control section for performing variable control for the status of the laser beam emitted from the light source section , and a light status measurement section for measuring the status of the laser beam inside the processing target TG. The light control section is adjusted based on the output of the light status measurement section so that the status of the laser beam inside the processing target becomes a desired status. Since the status of the laser beam inside the processing target, which is made of such a transparent medium as glass, is measured by the light status measurement section, and is fed back to the light control section, laser processing can be executed while maintaining an optimum status at a processing point inside the processing target.

Transparent medium processing device

An ultrashort pulse laser apparatus of the this invention includes (1) a laser medium, (2) a laser resonator which stores the laser medium and externally extracts a laser beam, and (3) an excitation source for outputting an excitation energy to the laser resonator to excite the laser medium. The laser resonator includes (i) a plurality of resonant mirrors disposed on both sides of the laser medium to form a resonant optical path, and (ii) a phase dispersion compensation unit which includes two optical members respectively arranged on two light input/output surface sides of the laser medium on the resonant optical path and compensates phase dispersion of light in the resonant optical path. That is, the laser medium is disposed in the optical path between the two optical members of the phase dispersion compensation unit. With this arrangement, even when the laser medium is arranged almost at the center of the laser resonator to stabilize mode locking, the cavity length of the resonant optical path can be reduced. Therefore, the repetition frequency of laser pulses can be increased, and simultaneously, size reduction of the laser apparatus itself can be achieved.

Ultrashort pulse laser apparatus

An optical delay apparatus that regularly alternately outputs beams having mutually different delays on one optical axis and that can variably set a delay amount of at least one beam. A motor 112 rotation-drives a rotating plate 111 in which reflective portions and transmissive portions are formed regularly alternately in the circumferential direction. When an incident beam I0 is incident to a reflective portion of the rotating plate 111, it is reflected to generate a beam I1. When the incident beam I0 is incident to a transmissive portion of the rotating plate 111, a beam I2 transmitted is reflected by a reflector 120 to become a beam I3, and the beam I3 is again transmitted by the transmissive portion of the rotating plate 111. This beam I3 has a delay different from that of the beam I1, and the beam I3 and the beam I1 advance regularly alternately in the same direction and on the same optical axis. Further, the reflector 120 is arranged as movable by a moving stage 130, and the delay amount of the beam I3 changes with movement of the reflector.

Optical delay apparatus

This invention has as its object to provide a voltage measurement apparatus which has a compact probe unit, and which can perform a measurement in a non-contact manner. The voltage measurement apparatus includes detection means for detecting an electric field generated in a space by a voltage applied to the surface of a device to be measured, light-emitting means for modulating output light by superposing a detected signal obtained from the detection means on a bias current which is supplied to inductively radiate the output light, a constant current source for supplying the bias current to the light-emitting means, extraction means for extracting a signal component of the output light from the light-emitting means, and light-transmission means for guiding the output light from the light-emitting means to the extraction means, and measures the applied voltage to the surface of the device to be measured by bringing the detection means close to the device to be measured in a non-contact manner.

Voltage detection apparatus

An electric field measuring apparatus for causing an optical probe head having an electro-optic member with an electro-optic material to oppose a sample such as a semiconductor integrated circuit device and for optically measuring a voltage of an opposite portion of the sample. The electro-optic material consists of an LiTaO.sub.3 electro-optic crystal or the like, the polarization characteristics of which change depending on the electric-field strength of the sample. The electro-optic member is supported on a guide mechanism to be reciprocally movable within a predetermined stroke range in a direction of the sample. The guide mechanism is reciprocated in the direction of the sample to control the distance between the electro-optic material and the sample. In measurement, light is incident on the electro-optic material whose polarization characteristics change depending on the electric-field strength, and the light intensity of a predetermined polarized component of the light reflected by the electro-optic material is detected, thereby measuring the electric-field strength and voltage of the sample. When if the electro-optic member is brought into contact with the sample, the sample is not damaged due to the stroke set in the guide mechanism. The simple structure of the guide mechanism realizes improvement of operability. The electro-optic member can therefore safety approach the sample to increase the measurement sensitivity.

Electro-optic apparatus for measuring an electric field of a sample

The liquid treating method according to the present invention introduces a bubble into liquid phase and applies vibration waves, such as ultrasonic waves, from each sides of the bubble. Collision of the vibration waves with the bubble imparts the compression pressure to the bubble. This effect is used to dissolve a gas forming the bubble into the liquid phase or to improve liquid quality of this liquid phase.

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Hamamatsu, Japan

Shinichiro Aoshima