Mitsubishi Electric Corporation

Panasonic Intellectual Property Management Co., Ltd.

Ebara Corporation

Topcon Corporation

Kabushiki Kaisha Topcon

Uchimura Co., Ltd.

Shinichi Okada

Hirotami Koike

Kenji Watanabe

Nobuo Kochi

Naoki Yasuda

Koji Imamura

Hiroki Shiota

Ryo Tajima

Masahiro Kumagawa

Yasuko Tsuruga

Motoo Nakagawa

Ryota Kusano

Masaya Inoue

Shinji Nishimura

Masahiro Hatakeyama

Akira Hashimoto

Shoji Yoshikawa

Hiroaki Kobayashi

Takashi Miyamoto

Tsutomu Karimata

Masahiro Yamamoto

Shogo Okamoto

Masahiro Inoue

Atsushi Sakaue

Tatsuro Hino

Hironori Tsuiki

Atsushi Maruyama

Kenji Terao

Kiwamu Tsukamoto

Kenichi Suematsu

Hirotaka Muto

Hiroyuki Osuga

Shinsuke Ogata

Shinkichi Sawa

Manabu Yoshinori

Ryuichi Kitora

Yutaka Ikura

Akifumi Nagao

Yasunori Komukai

Yasumichi Takai

Yoshinori Hiramatsu

Akira Higuchi

Takaaki Sato

Kou Inoue

Satoshi Kaga

Junichi Takahashi

Sumio Sasaki

Toshihiro Nagayama

Noboru Araki

Masami Saruya

Yoshikazu Terasawa

An article management system includes an acquirer and a management unit. The acquirer is configured to acquire identification information and management information. The identification information is information read from an electronic tag by the reading device in each of a plurality of bases in a distribution channel for an article, the electronic tag being attached to the article and storing the identification information. The management information is information collected in association with the identification information in a corresponding one of the plurality of bases, the management information relating to management of the article. The management unit is configured to manage the article with reference to the identification information and the management information which are acquired by the acquirer in each of the plurality of bases.

Article management system, reading device, article management method, and non-transitory computer-readable storage medium

A transmission system includes: an antenna; a control device including an RF circuit which transmits a first signal for controlling a radio wave to be outputted from the antenna and an external power supply which supplies direct current to the antenna; and a first transmission path which connects the antenna and the control device, and is used in transmission of the first signal and supplying of the direct current to the antenna.

Transmission system, antenna, control device, and transmission method

A power supply device (-) includes a substrate () on which an electric component () is mounted, a chassis () having a chassis surface () and a threaded part (), a chassis-side resin part () connected to a back surface () and the chassis surface (), a fixation screw (), and an insulating member (). The fixation screw () fixes both the electric component () and the substrate () to the chassis () by screw-coupling an end part () of the fixation screw (), exposed in a direction toward the chassis () from an open hole formed through the insulating member (), to the threaded part () of the chassis (). In addition, the fixation screw () brings the electric component () and the chassis () into electrical noncontact with each other by being placed in an open hole of the insulating member ().

Power supply device

Provided is an electron beam irradiation apparatus including: an aligner configured to perform an alignment of an electron beam by deflecting the electron beam; a deflector having a plurality of electrodes and configured to deflect the electron beam after passing through the aligner; and an adjuster configured to adjust deflection caused by the aligner, wherein the adjuster is configured to perform, on each of the plurality of electrodes, detecting an image of the electron beam by applying a test voltage to one of the plurality of electrodes and applying a reference voltage to the other electrodes, determine a position shift of the electron beam based on each position of the image of the electron beam corresponding to each electrode, and adjust deflection of the aligner so as to cancel the position shift of the electron beam.

Electron beam irradiation apparatus and electron beam alignment method

A charged particle multi-beam device includes a charged particle source, a collimator lens, a multi-light-source forming unit, and a reduction projection optical system. The multi-light-source forming unit has first to third porous electrodes disposed side by side in an optical axis direction. A plurality of holes for causing the multi-beams to pass is formed in each of the first to third porous electrodes. The first porous electrode and the third porous electrode have the same potential and the second porous electrode has potential different from the potential of the first porous electrode and the third porous electrode. A diameter of the holes on the second porous electrode is formed larger further away from an optical axis such that a surface on which the multi-light sources are located is formed in a shape convex to the charged particle source side.

Charged particle multi-beam device

A wireless reading system includes a goods path and a reader device. The goods path allows one or more goods held by a customer passing through a customer path to be moved along. The reader device is configured to perform wireless communication, whose medium is radio waves, with one or more electronic tags attached to the one or more goods while the one or more goods are moved along the goods path, thereby reading one or more pieces of goods information on the one or more goods, respectively.

Wireless reading system, shopping assistance system with the same, wireless reading method and shopping assistance method

A power supply device (-) includes: a substrate () on which an electric component () is mounted; a chassis () including a chassis surface () to be a surface facing one surface () of the substrate (); and cured insulating resin (-) to be placed between the one surface () of the substrate () and the chassis surface () so as to be connected to the one surface () and the chassis surface (), the cured insulating resin (-) having a thermal conductivity between 1 W/mK and 10 W/mK inclusive.

A Wien filter to be disposed inside a lens barrel made of a magnetic material includes: a plurality of electromagnetic poles disposed at equal angular intervals about a center axis of the lens barrel; a first magnetic shield disposed so as to cover the area around the plurality of electromagnetic poles; and a second magnetic shield disposed so as to cover the area around the first magnetic shield. The first magnetic shield is supported by a first support member made of a non-magnetic material provided at an inner surface of the second magnetic shield. The second magnetic shield is supported by a second support member made of a magnetic material provided at an inner surface of the lens barrel.

Wien filter and electron-optics apparatus

A wireless communications system according to an aspect includes a communications terminal, a detection unit, and a control unit. The communications terminal includes a communications unit to communicate wirelessly with a communications partner terminal. The detection unit detects movement of the communications terminal. The control unit controls the communications terminal so as to vary a communicable area of the communications unit. The communicable area is defined relatively to the communications terminal. The control unit varies the communicable area according to at least magnitude of the movement detected by the detection unit.

Wireless communications system and method for controlling communications terminal

Provided is a method of adjusting an electron-beam irradiated area in an electron beam irradiation apparatus that deflects an electron beam with a deflector to irradiate an object with the electron beam, the method including: emitting an electron beam while changing an irradiation position on an adjustment plate by controlling the deflector in accordance with an electron beam irradiation recipe, the adjustment plate detecting a current corresponding to the emitted electron beam; acquiring a current value detected from the adjustment plate; forming image data corresponding to the acquired current value; determining whether the electron-beam irradiated area is appropriate based on the formed image data; and updating the electron beam irradiation recipe when the electron-beam irradiated area is determined not to be appropriate.

Electron-beam irradiated area adjustment method and adjustment system, electron-beam irradiated region correction method, and electron beam irradiation apparatus

A side surface at the outside of a plurality of teeth portions of one separated core is faced to a side surface of teeth portions of an adjacent separated core, so as to form a second slot which is straddled between the adjacent separated cores, and a first slot is formed by a plurality of teeth portions of one separated core, and a width size of the first slot is identical to a width size of the second slot, and coil conductor storage space is formed in the first slot via a first insulating component, and coil conductor storage space is formed in the second slot via a second insulating component, and a thickness size of the first insulating component is different from a thickness size of the second insulating component.

Stator of rotary electric machine and rotary electric machine

An insulation inspection device for motors includes an inverter for driving a motor, a partial discharge detecting unit for determining soundness of the motor, and a control circuit for controlling the inverter. The control circuit adjusts a switching interval of a voltage pulse of the inverter so as to be equal to a pulse round-trip propagation time between the inverter and the motor, thereby generating surge voltage higher than driving voltage for the motor, between the motor and ground, and adjusts a switching time for each phase of the inverter, thereby generating surge voltage higher than driving voltage for the motor, between phases, thus performing insulation inspection.

Insulation inspection device for motors and insulation inspection method for motors

The present invention provides a displacement detector for a relative displacement of a fixed member and a movable member, which includes a first member and a second member. The first member is secured to the fixed member and composed of an insulator. The second member moves relative to the fixed member, integrally with the movable member. The second member is disposed opposite to the first member. The second member is composed of an insulator. Either of the first member and the second member includes an IC tag for detection performing non-contact communication, and the other includes a blocking member composed of a conductor blocking the communication performed by the IC tag. When the second member moves a predetermined amount relative to the first member, starting from an initial state, the IC tag for detection moves from inside to outside a region of the blocking member or vice versa.

Displacement detector, displacement detection apparatus, displacement detection system, loosening detector, loosening detection apparatus, and loosening detection system

A charged particle beam reflector device is configured to include at least two electrostatic mirrors arranged with a predetermined interval on a linear optical axis, each having a through hole through which a charged particle beam radiated from an electron gun along a linear optical axis passes, and having a function of reflecting the charged particle beam or allowing the charged particle beam to pass through the through hole in accordance with an applied voltage, and a controller controlling an applied voltage to the at least two electrostatic mirrors. The controller applies, to each of the electrostatic mirrors, a reflection voltage allowing the electrostatic mirrors to reflect the charged particle beam at a predetermined timing so that the charged particle beam from the electron gun is reflected by the at least two electrostatic mirrors a plurality of times.

Charged particle beam reflector device and electron microscope

The present invention provides a charged particle beam apparatus capable of preventing the charging-up of the specimen without using a large-scale facility. A scanning electron microscopeilluminates a specimenwith a charged particle beam via a charged particle optical system arranged in a column. According to the present invention, the scanning electron microscopehas a charge preventive memberdisposed between the objective lensand the specimen. The charge preventive memberhas an electrically conductive portion and an openingto transmit the charged particle beam. The charge preventive memberis formed so as to partly cover the charged particle optical system when viewed from the charged particle beam irradiation spot on the specimen. In addition, the charge preventive memberhas gas inflow pathsandformed therein. These gas inflow paths have gas injection outletsformed to inject gas toward the charged particle beam irradiation spot on the specimen.

Charged particle beam apparatus

Growing community of inventors

Tokyo, Japan

Shinichi Okada