Happyjapan, Inc.

Shinichi Hasebe

Masayoshi Yokoo

Keitaro Harada

Shouhei Matsumoto

Mitsuo Koizumi

Yoshinori Arai

An IC deviceof the present invention includes a robot armfor conveying IC devices D to a test headfor testing the IC devices. The test headincludes socketshaving placement surfacesonto which the IC devices D are placed and for attaching the IC devices placed on the placement surfaces to the test head. The robot armincludes a contact headfor holding the IC devices while the IC devices are conveyed and for pressing the IC devices onto the test head during testing, and a non-contact displacement meterthat moves in association with the movement of the contact head. The non-contact displacement meteris mounted on the robot armso as to measure a distance by emitting a beam in a direction perpendicular to the placement surfaces

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Yamagata, Japan

Shinichi Hasebe