Omron Corporation

Shingo Inazumi

Yutaka Kato

Akira Matsui

Jaewook Hwang

Naoki Nishimori

Jun Ota

Sayuki Nakada

Rie Masuda

Naoya Nakashita

Masaru Horie

Yuki Kimura

An image inspection apparatus includes: an image capturing unit which captures images of an object; a transparent illumination unit which has a light-emitting surface which radiates light to the object and is configured to be able to control a light-emitting position on the light-emitting surface and a radiation direction of the light; and a control unit which is configured to control the image capturing unit and the illumination unit. The control unit causes the illumination unit to change the light-emitting position and the radiation direction, causes the image capturing unit to capture images of the object, identifies a light-emitting position and a radiation direction of the illumination unit when a measurement point of the surface of the object is illuminated from images of the object, and calculates a distance to the measurement point on the basis of the identified light-emitting position and the identified radiation direction.

Image inspection apparatus and image inspection method

An image inspection device and a lighting device capable of setting an irradiation solid angle for each location of a visual field and capable of miniaturization are provided. The image inspection device includes a photographing portion that photographs the target, and a light transmissible lighting portion that is disposed between the target and the photographing portion and configured to irradiate light in a direction toward the target. The lighting portion includes a plurality of light-emitting portions that is arranged in a matrix form and configured to be capable of selectively emitting light, and an optical system configured to control irradiation directions of the light emitted from each of the plurality of light-emitting portions to be directions corresponding to positions of each of the plurality of light-emitting portions.

Image inspection device and lighting device

The image inspection apparatus includes an image capturing unit which captures images of an object, a transparent illumination unit disposed between the object and the image capturing unit, and a control unit configured to control the image capturing unit and the illumination unit. The illumination unit radiates light to the object in a first direction and causes the light to scan and radiates light to the object in a second direction and causes the light to scan. The image capturing unit captures images of the object. The control unit identifies a light-emitting position of the illumination unit when a measurement point of the surface of the object is illuminated from images of the object captured, and calculates a distance to the measurement point on the basis of the identified light-emitting position, the first direction and the second direction.

An illumination device includes illumination units for irradiating light on an object and a substrate member, which is an example of a holding mechanism for detachably holding the illumination units according to a predetermined disposition rule. The substrate member has a connection part for electrically connecting with a controller. The substrate member holds a part of the illumination units by linking parts.

Illumination device, illumination unit, and image processing system

An image inspecting apparatus includes at least one image capturing part, a lighting part, a control part including a moving part, a searching part analyzing an image captured by the image capturing part under a first image capturing condition and searching for a defect candidate from an object under inspection, and a determining part. When the searching part finds the defect candidate from the object under inspection, the control part controls an image capturing condition such that a part where the defect candidate is found by the searching part is photographed under a second image capturing condition that is clearer than the first image capturing condition. The determining part analyzes an image captured by the image capturing part under the second image capturing condition and determines whether the defect of the object under inspection is present or absent.

Image inspecting apparatus, image inspecting method and image inspecting program

Main body of image inspection camera

An appearance inspection system enabling a route to be easily set when a target is imaged while causing a relative position of an imaging device with respect to the target to be different is provided. A decision part decides a plurality of relative position candidates of the imaging device with respect to the target at which focus of a lens module is possible on the inspection target position with regard to each of a plurality of the inspection target positions on the target. A selection part selects relative positions one by one from corresponding plurality of relative position candidates for each of the plurality of inspection target positions and selects a route candidate satisfying a preset requirement from a plurality of route candidates generated by sequentially connecting the plurality of selected relative positions as a designation route.

Appearance inspection system, image processing device, setting device, and inspection method

An image processing system and a setting method capable of performing lighting setting of illumination in a simpler manner are provided. The control device () evaluates evaluation lighting patterns (xi) one by one to calculate evaluation values (Pi), and uses coefficients () determined based on the evaluation values (Pi) to linearly combine each evaluation lighting pattern (xi) to determine a lighting pattern for measurement (L).

Image processing system and setting method

A controller includes a specifying part and a reception part. The specifying part specifies positions where the illumination units are connected. The reception part presents a lightable area and an unlightable area in different modes based on the positions where the illumination units are connected, the positions being specified by the specifying part. The reception part receives settings of the lighting conditions for the lightable area.

Controller and image processing system

An inspection system is provided with an inspection device configured to examine the external features of an object; and a control device for controlling the inspection device;

Inspection system

An illumination apparatus includes lenses, a first casing that has a radiation plane provided with annularly arranged windows for attaching the lenses, respectively, independently, and that has an opening at a position opposite to the radiation plane, and a first substrate associated with each of the lenses and accordingly disposed. The first substrate has at least one light emitting device mounted thereon. The first casing includes a holding portion associated with each of the windows. The holding portion each permits the lens to be attached to the first casing from a side thereof having the opening and also restrains the lens from moving through the first casing toward the radiation plane, and when the lens is attached to the first casing, the lens has an optical axis in a direction having a predetermined angle relative to a center axis of the first casing.

Illumination apparatus

An illumination apparatus includes an elongate chassis, a plurality of light emitting devices, a plurality of lenses, an elongate populated board, an elongate holding member, and a heat radiation member. The chassis includes a supporting portion supporting the opposite, longer-side ends of the populated board and a first engagement portion fitting and securing the holding member to the chassis. The holding member includes a plurality of second engagement portions fitting and securing each lens to the holding member and a resilient biasing portion resiliently biasing the longer-side ends of the populated board toward the supporting portion. The populated board is pinched and secured by the resilient biasing portion and the supporting portion and the heat radiation member is sandwiched and thus secured by the populated board and a bottom wall in contact with the populated board and the bottom wall.

Growing community of inventors

Kyoto, Japan

Shingo Inazumi