Sony Corporation

Sony Corporaiton

Shingo Imanishi

Motohiro Furuki

Masataka Shinoda

Toshiyuki Kashiwagi

Minoru Takeda

Masanobu Yamamoto

Gakuji Hashimoto

Suguru Dowaki

Taichi Takeuchi

Shunpei Suzuki

Goro Fujita

Hisayuki Yamatsu

Yoshitsugu Sakai

Shin Masuhara

Masashi Kimoto

Fumitaka Otsuka

Nobuyuki Arakawa

Nao Nitta

Yuya Suzuki

Seiji Kobayashi

Kimihiro Saito

Tatsumi Ito

Akitoshi Suzuki

Koji Ashizaki

Minoru Tobita

Takeo Arai

Masaya Kakuta

Koji Futamura

Toru Takashimizu

Kazushi Miyake

Suguro Dowaki

The present technology provides a technology for stabilizing break-off timings. Therefore, according to the present technology, there is provided a microparticle analysis device or the like including at least: a flow path in which a fluid including a sample flow containing microparticles and a sheath flow flowing to contain the sample flow; a droplet formation unit configured to form a droplet in the fluid by imparting vibration to the fluid using a vibration element; an electric charge application unit configured to apply electric charge to a droplet containing the microparticles; an imaging unit configured to obtain a photo of a phase of a certain time; and a control unit configured to control a timing at which the droplet breaks off on a basis of the photo.

Microparticle analyzer and microparticle analysis method

Micro particle analyzer and micro particle analysis method

To provide a technique capable of highly accurately measure the intensity and the spectrum of fluorescence and scattered light by effectively correcting measurement error that occurs due to variation of flow positions of fine particles in a channel. A data correction method for a fine particle measurement device is provided, which includes an intensity detection procedure capable of detecting light generated from a fine particle by emitting light onto the fine particle flowing through a channel, and obtaining intensity information about the light, a position detection procedure capable of obtaining position information about the fine particle, and a correction procedure for correcting the intensity information on the basis of the position information.

Data correction method in fine particle measuring device and fine particle measuring device

A microparticle measuring apparatus for highly accurately detecting the position of a microparticle flowing through a flow channel includes a light irradiation unit for irradiating a microparticle flowing through a flow channel with light, and a scattered light detection unit for detecting scattered light from the microparticle, including an objective lens for collecting light from the microparticle, a light splitting element for dividing the scattered light from the light collected by the objective lens, into first and second scattered light, a first scattered light detector for receiving an S-polarized light component, and an astigmatic element disposed between the light splitting element and the first scattered light detector, and making the first scattered light astigmatic. A relationship between a length L from a rear principal point of the objective lens to a front principal point of the astigmatic element, and a focal length f of the astigmatic element satisfies the following formula I.1.5&#x2266;2.5&#x2003;&#x2003;(I)

Microparticle measuring apparatus

Disclosed herein is an optical measuring device including: a light applying section configured to apply exciting light to a sample flowing in a channel; and a scattered light detecting section configured to detect scattered light generated from the sample irradiated with the exciting light on the downstream side of the sample in the traveling direction of the exciting light; the scattered light detecting section including a scattered light separating mask for separating the scattered light into a low numerical aperture component having a numerical aperture not greater than a specific value and a high numerical aperture component having a numerical aperture greater than the specific value; a first detector for detecting the low numerical aperture component; and a second detector for detecting the high numerical aperture component.

Optical measuring device and optical measuring method

A microparticle measuring apparatus for highly accurately detecting the position of a microparticle flowing through a flow channel includes a light irradiation unit for irradiating a microparticle flowing through a flow channel with light, and a scattered light detection unit for detecting scattered light from the microparticle, including an objective lens for collecting light from the microparticle, a light splitting element for dividing the scattered light from the light collected by the objective lens, into first and second scattered light, a first scattered light detector for receiving an S-polarized light component, and an astigmatic element disposed between the light splitting element and the first scattered light detector, and making the first scattered light astigmatic. A relationship between a length L from a rear principal point of the objective lens to a front principal point of the astigmatic element, and a focal length f of the astigmatic element satisfies the following formula I.1.5&#x2266;L&#x2266;2.5&#x2003;&#x2003;(I)

Disclosed is a fine particle measurement apparatus including a light condensing unit that condenses irradiated light irradiated to a sample flow where fine particles pass through and directly propagates the light without scattering, and scattered light scattered by the fine particles to an optical receiver divided into a plurality of regions; a position controller that controls the relative positions of members of an optical path; and a control unit that detects positions of condensing spots of the irradiated light and the scattered light based on signal intensities of each region of the optical receiver, and controls the position controller such that the positions of the condensing spots of the irradiated light and the scattered light match with each other.

Fine particle measurement apparatus and optical axis calibration method

A fine particle measuring method of performing optical measurement of fine particles introduced into a plurality of sample fluidic channels provided at predetermined distances on a substrate by scanning light to the sample fluidic channels is disclosed. The method includes: sequentially irradiating the light to at least two or more reference regions provided together with the sample fluidic channels; detecting a change of optical property occurring in the light due to the reference regions; and controlling timing of emission of the light to the sample fluidic channels.

Fine particle optical measuring method in fluidic channels

A pattern-formed substrate is provided. The pattern-formed substrate includes a substrate base, an organic thin film and an inorganic resist film stacked on the substrate base in this order, and patterns having predetermined aspect ratios formed on the organic thin film and the inorganic resist film, respectively. The pattern of the organic thin film is formed by selective etching using the pattern of the inorganic resist film as a mask.

Pattern-formed substrate, pattern-forming method, and die

A microchip includes a sample liquid feed channel permitting a sample liquid containing particulates to flow through, at least one pair of sheath liquid feed channels configured to merge to the sample liquid feed channel from both sides thereof for permitting a sheath liquid to flow through surrounding the sample liquid, a merging channel connected to the sample liquid feed channel and the one pair of the sheath liquid feed channels for permitting the sample liquid and the sheath liquid to merge and flow through the merging channel, a vacuum suction unit for drawing into the particulate subject to collection, connected to the merging channel, and at least one pair of discharge channels formed on both sides of the vacuum suction unit for permitting to flow through from the merging channel.

Microchip and particulate fractional collection apparatus

An optical measuring device includes: a light applying section configured to apply laser light to a sample flowing in a channel; and a fluorescence detecting section configured to detect fluorescence generated from the sample irradiated with the laser light; the fluorescence detecting section including a multichannel photomultiplier tube having a plurality of detection channels capable of simultaneously detecting a plurality of light beams, a light separator configured to separate the fluorescence according to wavelengths to provide the plurality of light beams, the light separator being provided by a transmission grating or a prism, and a telecentric condenser lens configured to receive the plurality of light beams from the light separator and direct the plurality of light beams toward the plurality of detection channels of the multichannel photomultiplier tube so that the optical axes of the plurality of light beams are parallel to each other.

Optical measuring device

A method for manufacturing a microlens includes forming a microlens by pressing a microlens mold having a reverse shape of a microlens formed therein on a microlens-forming film formed on a substrate to transfer the reverse shape of the microlens to the microlens-forming film. The microlens mold is formed by irradiating an inorganic resist film which is formed on a mold substrate with exposure light by relative two-dimensional scanning, and etching an exposed region of the inorganic resist film to form the reverse shape of the microlens. The irradiation intensity of the exposure light is adjusted to correspond to the depth of the reverse shape of the microlens from the surface of the inorganic resist film on the basis of profile data of the reverse shape of the microlens.

Method for manufacturing microlens and method for manufacturing solid-state image sensor

An optical measuring instrument includes: a flow channel for allowing a specimen to be circulated therein; a first light source including a light emitting diode for emitting light to be used for optical adjustment and/or image confirmation in the flow channel; a second light source for irradiating light upon the specimen circulated in the flow channel; and a light detector for detecting the spectrum intensity of the light emitted from the first and second light sources.

Optical flow channel measuring instrument

Disclosed herein is an optical measuring device, including: a plurality of microfluidic channels extending in parallel to each other; and a scanning section configured to scan a plurality of measuring light beams in a scanning direction in which the microfluidic channels are juxtaposed to optically measure fine particles introduced into the microfluidic channels.

Growing community of inventors

Kanagawa, Japan

Shingo Imanishi