Adv Antest Corporation

Tyco Electronics Amp K.k.

Molex Japan Co., Ltd.

Molex Corporation

Shin Sakiyama

Makiya Kimura

Takahiro Hatano

Tomoyuki Takamoto

Akinori Mizumura

Takashi Sekizuka

Hiroyuki Hama

Teruhito Suzuki

Hiromitsu Takasu

Kyoko Oniyama

Tadao Saito

Toshihiro Niitsu

Shigeru Matsumura

Nobumasa Motohashi

Tetsuya Kuitani

Hirotaka Wagata

Masato Okano

Hiroyuki Yajima

Takashi Sokizuka

In a cable assembly, when auxiliary ground conductor is provided so as to face the lower surface of supporting insulating member, elastically-deformed piece in an elastically deformed status comes in contact with the tip of ground terminal protruding from the lower surface of supporting insulating member.

Coaxial cable member coupled to a signal terminal, a ground terminal and an auxiliary ground conductor with an elastically-deformable piece

Each of the signal terminal and the ground terminal includes a first extending portion extending toward its tip end, and a second extending portion extending in a direction opposite to the first extending portion. The first extending portion is formed such that a width thereof is smaller than a width of the second extending portion. The housing includes a first housing into which the first extending portions are inserted, and a second housing into which the second extending portions are inserted. The second housing is formed separately from the first housing, and the first housing includes a wall portion located between the first extending portion of the signal terminal and the first extending portion of the ground terminal.

Connector and semiconductor testing device including the connector

A connector includes a first terminal. The first terminal includes a movable portion, and the movable portion has, on its tip side, a contact portion located on a course C of a case assembly. Further, the first terminal includes a fixed portion restricted from moving and located on a base side of the movable portion. The movable portion is elastically deformable to incline toward a side surface of an insertion hole while using the fixed portion as a fixed point. Further, the movable portion includes a hit portion between the contact portion and the fixed portion. The hit portion is located apart from the side surface of the insertion hole, and the hit portion is provided capable of hitting, midway during inclining of the movable portion toward the side surface of the insertion hole, against the side surface of the insertion hole.

The connector includes an enclosure including insertion holes formed therein, into which tip end portions of coaxial cables provided with signal terminals and with ground terminals arranged at parts of peripheries of the signal terminals are inserted, and auxiliary ground conductors, which are retained by the enclosure, are electrically connected to the ground terminals, and are arranged at other parts of the peripheries of the signal terminals.

Connector, cable assembly, and semiconductor testing device

A connector includes a signal terminal, an insulating member, a ground terminal and an enclosure. The signal terminal has a main body extending in one direction, and a contact arm provided on each side of the main body for contacting another conductor. The insulating member encloses the main body. The ground terminal has a cylindrical main body enclosing the insulating member, and a contact arm provided on each side of the cylindrical main body for contacting another conductor. The cylindrical main body includes first and second semi-cylindrical parts, each having semi cylindrical shapes. The semi-cylindrical parts make a cylindrical shape as a whole by both end parts of the circumferential direction being assembled so as to mutually overlap. An insertion hole is formed in the enclosure where an assembly of the signal element, the insulating member and the ground terminal are inserted.

Connector and semiconductor test device

An edge connector is disclosed, having a configuration in which board contacting portions of terminals coming into contact with both ends of the board are displaced, an overall spring portion of each terminal applying an biasing force to the board contacting portions are displaced, and the surface of a cover member displacing the spring portion is configured as a sloped surface. Due to this configuration, it is possible to apply a stable biasing force to the board contacting portion without plastically deforming the terminals and to bring the board contacting portion of the terminal into secure contact with the board even when the thickness of the board varies greatly.

Edge connector

Electrical connector housing

A board mount-type connector having an insulative housing with a base and a row of contacts carried by the housing is disclosed. Each contact has a centerpiece secured to the housing along a substantially vertically upright inner wall of the base, a mating interface connected to one end of the centerpiece so that the mating interface contacts a mating contact, and a board interface connected to the remaining end of the centerpiece so that the board interface connects to a circuit board. Each board interface has a bend that initially extends away from an extension line associated with a generally vertically upright portion of the respective centerpiece and that is bent back toward the extension line. A pad interface extends from the free end of the board interface toward the extension line and the contacts of the row are staggered along a length of the row.

Board mount-type connector and board mount-type connector assembly

Electrical connector

A contact terminal for measurement is provided, for transmitting a signal between a desired probe pin among a plurality of probe pins arranged in parallel at a predetermined distance in a predetermined direction on the surface of a probe substrate and an external measurement apparatus. The contact terminal for measurement includes: a signal terminal having an width smaller than the distance between the probe pins provided on both sides of one probe pin in the arrangement direction; two ground terminals to which a ground potential is applied, which are provided on both sides of the signal terminal in the arrangement direction and which have each width larger than that of the signal terminal in the arrangement direction; and a signal line electrically connecting the signal terminal to a signal input terminal of the external measurement apparatus.

Contact terminal for measurement, measurement apparatus, probe card set, wafer probe apparatus, and testing apparatus

A socket electrically coupled to a BGA unit includes a plurality of ball contacts including a housing wherein a through-hole having a larger diameter than that of the ball contact is formed in a surface of the housing, which faces the BGA unit, in order to the through-hole corresponds the plurality of ball contacts and a pin contact provided in a plurality of through-holes and contacting a corresponding side part of the ball contact. More desirably, the plurality of pin contacts is provided in order that each extending directions of the pin contacts are opposite to one another.

Growing community of inventors

Tokyo, Japan

Shin Sakiyama