Lake Shore Cryotronics, Inc.

Toyo Corporation

Shin Mizuta

Masaki Yamaguchi

Edward C Maloof

Jason C Caudill

Edward Maloof

To eliminate or otherwise reduce unintended movement of a probe tip of a probe assembly being held by a probe arm, the probe assembly includes one or more resilient members that compensate for the contraction or expansion of the probe arm in accordance with the coefficient of thermal expansion of the material from which the probe arm is made. Thus, the probe tip can remain in contact with a sample being measured at the desired location on the sample, during an automated full or wide scale temperature range sweep.

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Osaka, Japan

Shin Mizuta