National Central University

Shin-Kai Tsai

Ju-Yi Lee

A SPR measuring device is proposed. The measuring device includes a circularly polarized heterodyne light source that produces a circularly polarized heterodyne light beam, a beam splitting element that splits the circularly polarized heterodyne light beam into a reference beam and a signal beam, a first light sensing unit that receives a reference light intensity of the reference beam, a SPR sensor that receives the signal beam and reflects a reflected signal beam, a second light sensing unit that receives a reflected light intensity of the reflected signal beam and a processing circuit that calculates a phase difference between the reference light intensity and the reflected light intensity. A phase change caused by SPR of an incident light is sensitively represented by the circularly polarized heterodyne light beam. Thus tiny changes in physical quantities of analytes are measured easily.

Growing community of inventors

Taoyuan County, Taiwan

Shin-Kai Tsai