Hitachi High-tech Corporation

Hitachi-high-technologies Corporation

Shin Imamura

Yoshifumi Sekiguchi

Hajime Kawano

Shahedul Hoque

Sakuichiro Adachi

Shunsuke Mizutani

Makoto Suzuki

Takashi Ohshima

Yuya Matsuoka

Takahiro Ando

Takeshi Ishida

Tomoto Kawamura

Toshiaki Kusunoki

Tomonobu Tsuchiya

Masaaki Komatsu

Eiichiro Takada

Yasuhiro Keta

Uki Ikeda

Eri Takahashi

Takumu Iwanaka

Yuichiro Hashimoto

Yoichi Ose

Isao Yamazaki

Masuyuki Sugiyama

Makoto Arai

Kiyomi Yoshinari

Michio Hatano

Takayuki Kanda

Shuhei Yabu

Kenichi Hirane

Laila Ambar Sari

Hiromitsu Mori

Provided is an automatic analysis device capable of obtaining a stable light intensity over a wide wavelength band by multiplexing a plurality of LED lights and adjusting the temperature characteristics of each LED element. The automatic analysis device according to the present disclosure is configured such that light emitted from a second LED is reflected to be multiplexed on the same optical axis as the light emitted from a first LED, and the first LED and the second LED are in contact with the same temperature adjustment member.

Automatic analysis device

Provided are a charged particle detector and a radiation detector capable of obtaining an observation image with correct contrast without saturation even when the number of signal electrons incident on a detector is increased due to an increase in the current of a primary electron beam. The charged particle detector is characterized by having a scintillator () having a signal electron detection surface () for detecting signal electrons emitted when a specimen is irradiated with primary electrons and converting the signal electrons into light, a light detector () having a light detection surface () for detecting the light emitted from the scintillator (), and a light guide () disposed between the scintillator () and the light detector (), wherein the area of the light detection surface () is larger than the area of the signal electron detection surface ().

Charged particle detector, charged particle ray device, radiation detector, and radiation detection device

A charged-particle detecting deviceor a radiation detecting devicedetects charged particles or radiation as a detection target. These detection devices are each provided with: a scintillatorprovided with a fluorescent layerthat converts the detection target into light; a light detectorthat detects the lightemitted from the scintillator; a light guideprovided between the scintillatorand the light detector; and a blocking partthat blocks a portion of the detection target incident on the scintillatoror the light emitted from the scintillator

Device for detecting charged particles or radiation

Provided are a scintillator and the like capable of improving emission intensity. A scintillator (S) comprises a sapphire substrate (), a GaN layer () that is provided on the incident side to the sapphire substrate () and includes GaN, a quantum well structure () provided on the incident side to the GaN layer (), and a conductive layer () provided on the incident side to the quantum well structure (), wherein a plurality of emitting layers () including InGaN and a plurality of barrier layers () including GaN are alternatively stacked in the quantum well structure (), and an oxygen-containing layer () including oxygen is provided between the quantum well structure () and the conductive layer ().

Scintillator, measuring device, mass spectrometer, and electron microscope

The present invention implements an ion detector with which it is possible to avoid direct collisions of negative ions with a scintillator, prevent degradation of the scintillator, prolong life of the scintillator, reduce the need for maintenance, and perform highly sensitive detection of both positive and negative ions. With respect to a reference lineconnecting a central pointof a positive ion CDand a central pointof a counter electrode, a central pointof a negative ion CDis provided in a region of a side opposite to a region of a side of a central pointof a scintillator. Positive ions entering from an ion entrancereceive a deflection force and collide with the positive ion CDto generate secondary electrons. The generated secondary electrons collide with the scintillatorto generate light. The generated light passes through a light guideand is detected by a photomultiplier tube. A negative potential barrier is generated along the reference line. Negative ions entering form the ion entranceare attracted to and collide with the negative ion CDto generate positive ions. The generated positive ions collide with the positive ion CDto generate secondary electrons. The generated secondary electrons collide with the scintillatorand are detected by the photomultiplier tube

Ion detector

This invention is capable of improving performance of a biochemical analyzer and facilitating the maintenance. A light source includes: a first LED that emits ultraviolet light and a second LED that has a light emission spectrum different from that of the first LED, the first LED and the second LED being disposed in parallel; a reflection surface that is opposite to the first LED and reflects light of the first LED; and a dichroic surface that is opposite to the second LED, reflects light of the first LED, and allows light of the second LED to penetrate. When an optical member including the dichroic surface is made to be the dichroic prism, the reflection surface reflects light of the first LED to the second LED side, and by using light source of a configuration having a light shielding unit between a light emission surface of the second LED and a dichroic prism, entering of a light emitted from the plural LEDs as a one light beam (beam) to an optical system of latter stage of the biochemical analyzer is enabled.

Light source and biochemical analyzer

The purpose of the present invention is to provide a scintillator for a charged particle beam device and a charged particle beam device which achieve both an increase in emission intensity and a reduction in afterglow intensity. This scintillator for a charged particle beam device is characterized by comprising a substrate (), a buffer layer () formed on a surface of the substrate (), a stack () of a light emitting layer () and a barrier layer () formed on a surface of the buffer layer (), and a conductive layer () formed on a surface of the stack () and by being configured such that the light emitting layer () contains InGaN, the barrier layer () contains GaN, and the ratio b/a of the thickness b of the barrier layer () to the thickness a of the light emitting layer () is 11 to 25.

Scintillator for charged particle beam apparatus and charged particle beam apparatus

A broadband light source device in a biochemical analyzing device, and facilitates maintenance thereof, including an LED substrate that is provided with an LED chip generating a light beam having a first wavelength band and including a fluorescent substance in the light beam having a first wavelength band and that is provided with an LED chip generating a light beam having a second wavelength band, in which the fluorescent substance includes at least alumina and at least one of Fe, Cr, Bi, Tl, Ce, Tb, Eu, and Mn and is produced by calcining a raw material that contains sodium at 6.1 to 15.9 wt. % in the whole raw material. The broadband light source device further includes an optical system including a light pipe that color-mixes the light beam passing through the fluorescent substance of the LED chip and the light beam emitted from the LED chip, and a flat dichroic prism.

Broadband light source device and biochemical analyzing device

A charged particle beam apparatus using a light guide that improves light utilization efficiency includes a detector including a scintillator for emitting light when a charged particle is incident, a light receiving element, and a light guide for guiding the light from the scintillator to the light receiving element. The light guide includes: an incident surface that faces a light emitting surface of the scintillator and to which the light emitted by the scintillator is incident; an emitting surface that is configured to emit light; and a reflecting surface that is inclined with respect to the incident surface so that the light from the incident surface is reflected toward the emitting surface. The emitting surface is smaller than the incident surface. A slope surface is provided between the incident surface and the emitting surface, faces the reflecting surface, and is inclined with respect to the incident surface.

Charged particle beam apparatus

An automatic analysis apparatus comprises: a light source generating light having a center wavelength equal to or shorter than 340 nm; a fluorescent substance excited by the light source light, and generates light together with transmitted light from the light source, having a wavelength of 340 nm to 800 nm; a condenser lens; at least one slit; a reaction cell holding a reaction solution where a specimen and reagent are mixed, and that the light source light and the light from the fluorescent substance enter; and a detector that detects light transmitted through the reaction cell. The light source, fluorescent substance, condenser lens, and slit are provided along a straight light corresponding to the optical axis. The width of the slit's opening is equal to or narrower than the width of a ray forming an image of the light source at the position of the slit.

Automated analysis device

In order to improve a yield of light generated by a collision between secondary electrons and gas molecules, the invention provides a charged particle beam device including: a charged particle beam source configured to irradiate a sample with a charged particle beam; a sample chamber configured to hold the sample and a gas molecule; a positive electrode configured to form an electric field that accelerates a secondary electron emitted from the sample; a photodetector configured to detect light generated by a collision between the accelerated secondary electron and the gas molecule; and a light condensing unit disposed between the sample and the photodetector, having a light emitting space in which the light is generated, and configured to condense the light generated in the light emitting space on a photodetector side.

Charged particle beam device

The objective of the present invention is to provide a charged particle detector and a charged particle beam device with which it is possible to acquire a high luminous output while rapidly eliminating charged particles that are incident to a scintillator. In order to achieve said objective the present invention proposes: a charged particle detector provided with a light-emitting unit including a laminated structure obtained by laminating a GaInN-containing layer and a GaN layer, and provided with a conductive layer that is in contact with the GaInN-containing layer on the charged particle incidence surface side of the laminated structure; and a charged particle beam device.

Charged particle detector including a light-emitting section having lamination structure, charged particle beam device, and mass spectrometer

The disclosure provides a charged particle detector including a scintillator that emits light with stable intensity and obtains high light emission intensity regardless of an energy of an incident electron. The disclosure provides the charged particle detector including: a first light-emitting part () in which a layer containing GaAlInN (where 0&#x2264;x&#x3c;1, 0&#x2264;y&#x3c;1) and a layer containing GaN are alternately laminated; a second light-emitting part () in which the layer containing GaAlInN (where 0&#x2264;x&#x3c;1, 0&#x2264;y&#x3c;1) and the layer containing GaN are alternately laminated; and a non-light-emitting part () that is interposed between the first light-emitting part () and the second light-emitting part () (see FIG.).

Charged particle detector and charged particle beam apparatus

A charged particle beam device includes a scintillator and

Growing community of inventors

Tokyo, Japan

Shin Imamura