Fujitsu Corporation

University of Michigan

Shin-ichi Wakana

Soichi Hama

Kazuyuki Ozaki

Akinori Miyamoto

Toshiaki Nagai

John A Nees

An electrooptic voltage waveform measuring apparatus, which includes an electrooptic element having an electrooptic effect; a first electrode mounted on the electrooptic element and electrically coupled to an object to be measured; and a first light source irradiating a light on the electrooptic element. The electrooptic voltage waveform measuring apparatus further includes a polarization analyzer for analyzing a polarization state of the light passed through the electrooptic element and detecting a voltage waveform of the object; a second electrode mounted on the electrooptic element and separated from the first electrode; and an amplifier having an input terminal coupled to the second electrode and outputting a low-frequency component of the voltage waveform of the object. The electrooptic voltage waveform measuring apparatus further includes a voltage waveform combining processor obtaining a measured voltage waveform of the object by combining a high-frequency component of the voltage waveform of the object obtained from an output of the polarization analyzer and the low-frequency component of the voltage waveform of the object output from the amplifier.

Electrooptic voltage waveform measuring method employing light sampling technique using Pockels effect

Electrooptic voltage waveform measuring method and apparatus

An ultrafast scanning probe with 2.5-picosecond response time and 10-nanometer spatial resolution. In one embodiment, a single probe tip is formed on an input electrode layer which is at least partially formed on a cantilever portion of the probe. The cantilever portion is formed by at least one layer including a film of AlGaAs which has a reflective top surface to reflect a laser beam therefrom. A photoresponsive planar switch is formed by a portion of the input electrode layer, a semiconductor portion of the at least one layer and a portion of an output electrode layer. In another embodiment, the switch is a non-planar photoresponsive switch. The single probe tip of the probe is utilized to both acquire an image of an electronic device and measure electrical signals of the device. An optical fiber may be used for support and to supply a pulsed switching beam to the photoresponsive switch.

Ultrafast electrical scanning force microscope probe

Growing community of inventors

Kawasaki, Japan

Shin-ichi Wakana